基于FPGA控制AD1674的verilog程序

这是七找八找，找的一些资料，供初学者使用！ 有一点得提前说明，这是英文文档，如果不喜欢阅读英文的文档的，就不要花冤枉币了！STM32F0 参考手册 编程手册

二进制转换十进制例：  01100100 =100  第0位：0*2^0=0  第1位：0*2^1=0  第2位：1*2^2=4  第3位：0*2^3=0  第4位：0*2^4=0  第5位：1*2^5=32  第6位：1*2^6=64  第7位：0*2^7=0         4 32 64=100八进制转换十进制例：  1507=839  第0位：7*8^0=7  第1位：0*8^1=0  第2位：5*8^2=320  第3位：1*8^3=512         7 320 512=839十六进制转换十进制例：  2AF5=10997  第0位：5*16^0=5  第1位：F*16^1=240  第2位：A*16^2=2560  第3位：2*16^3=8192         5 240 2560 8192=10997十进制转换八进制例：  120=170  120 120/8 15 0  15  15/8  1  7  1   1/8   0  1十进制转换二进制和十进制转换八进制一样只是把除数变成2。十进制转换十六进制例：  120=78  120 120/16 7 8  7   7/16   0 7二进制转换十六进制例:  二进制转换十六进制是以4位一段分别转换为十六进制。  权值：23=8,22=4,21=2,20=1  所以：1111=F 二进制                  十进制               十六进制 1111            8 4 2 1=15                      F 1110            8 4 2 0=14                      E ......1111 1101 , 1010 0101 , 1001 1011  F    D  ,   A    5  ,   9   B原码：    一个整数，按照绝对值大小转换成二进制，成为原码。  例：00000000 00000000 00000000 00000101 是5的原码反码：   将二进制数按位取反，所得的新二进制数称为原二进制数的反码。   取反操作指：1变0；0变1例：    00000000 00000000 00000000 00000101每一位取反，得11111111 11111111 11111111 11111010   称：00000000 00000000 00000000 00000101是11111111 11111111 11111111 11111010的反码补码：     反码加1称为补码    也就是说，要得到一个数的补码，先得到反码，然后将反码加上1，所得数称为补码例：00000000 00000000 00000000 00000101是11111111 11111111 11111111 11111010的反码   那么，补码位：11111111 11111111 11111111 11111010 1=11111111 11111111 11111111 11111011

鲁棒统计，现代统计方法， Robust Statistics第二版，学习现代统计方法R○ BUST STAT|STCSSecond editionPeter j, huberProfessor of Statistics, retiredKlosters SwitzerlandEⅣ ezio m. RonchettiProfessor of StatisticsUniversity of Geneva, SwitzerlandWILEYA JOHn WileY SONS INC. PUBliCAtIONCopyrightc 2009 by John Wiley Sons, Inc. All rights reservedPublished by John Wiley sons, Inc, Hoboken, New JerseyPublished simultaneously in CanadaNo part of this publication may be reproduced, stored in a retrieval system, or transmitted in any form orby any means, electronic, mechanical, photocopying, recording, scanning, or otherwise, except aspermitted under Section 107 or 108 of the 1976 United States Copyright Act, without either the priorwritten permission of the Publisher, or authorization through payment of the appropriate per-copy fee tothe Copyright Clearance Center, Inc, 222 Rosewood Drive, Danvers, MA 01923, (978)750-8400, fax978)750-4470,oronthewebatwww.copyrigom. requests to the publisher for permission shouldbe addressed to the permissions department John Wiley sons, Inc., 11 1 River Street, Hoboken, NJ07030,(201)748-6011,fax(201)748-6008,oronlineathttp:/www.wileycom/go/permissionLimit of Liability /Disclaimer of Warranty: While the publisher and author have used their best efforts inpreparing this book, they make no representations or warranties with respect to the accuracy orcompleteness of the contents of this book and specifically disclaim any implied warranties ofmerchantability or fitness for a particular purpose. No warranty may be created or extended by salesrepresentatives or written sales materials. The advice and strategies contained herein may not be suitablefor your situation. You should consult with a professional where appropriate. Neither the publisher norauthor shall be liable for any loss of profit or any other commercial damages, including but not limitedto special, incidental, consequential, or other damagesFor general information on our other products and services or for technical support, please contact ourCustomer Care Department within the United States at(800)762-2974, outside the United States at(317)572-3993 or fax(317)572-4002.Wiley also publishes its books in a variety of electronic formats. Some content that appears in print maynot be available in electronic format. For information about wiley products, visit our web site atwww.wileycomLibrary of Congress Cataloging-in-Publication Data:Huber Peter JRobust statistics, second edition/ Peter J. Huber, Elvezio ronchettip. cnIncludes bibliographical references and indeISBN978-0-470-12990-6( cloth)1. Robust statistics. I. Ronchetti. elvezio. II. TitleQA276.H7852009519.5-dc222008033283Printed in the United States of america10987654321To the memory o1John w. tukeyThis Page Intentionally Left BlankCONTENTSPrefacePreface to first editionGeneralities1 Why robust Procedures1. 2 What Should a robust procedure achieve?1.2.1 Robust. Nonparametric and Distribution-Free1.2.2 Adaptive procedures1.2.3 Resistant Procedures1.2. 4 Robustness versus Diagnostics1.2.5 Breakdown point1.3 Qualitative Robustness567888911. 4 Quantitative Robustness1.5 Infinitesimal Aspects141.6 Optimal Robustness171.7 Performance Comparisons18CONTENTS1.8 Computation of robust estimates181.9 Limitations to Robustness Theory202 The Weak Topology and its Metrization23eneral remarks232.2 The Weak Topology232.3 Levy and prohorov metrics272.4 The bounded Lipschitz metric322.5 Frechet and Gateaux derivatives366 Hampels Theorem413 The Basic Types of Estimates453. 1 General Remarks453.2 Maximum Likelihood Type Estimates(M-Estimates)3.2.1 Influence Function of m-estimates73.2.2 Asymptotic Properties of M-Estimates483.2.3 Quantitative and Qualitative Robustness of MEstimates3.3 Linear Combinations of Order Statistics(L-Estimates)3.3.1 Influence Function of -Estimates3.3.2 Quantitative and Qualitative robustness of l-Estimates 593. 4 Estimates Derived from Rank Tests(R-estimates3.4.1 Influence Function of R-Estimates623.4.2 Quantitative and Qualitative robustness of R-Estimates 643.5 Asymptotically Efficient M-, L,and R-Estimates674 Asymptotic Minimax Theory for Estimating Location4.1 General remarks4.2 Minimax bias4.3 Minimax Variance: Preliminaries744. 4 Distributions minimizing fisher Information764.5 Determination of Fo by Variational Methods814.6 Asymptotically Minimax M-Estimates914.7 On the minimax Property for L-and R-estimates954.8 Redescending m-estimates74.9 Questions of Asymmetric Contamination101CONTENTSScale Estimates1055.1 General remarks1055.2 M-Estimates of scale1075.3 L-Estimates of scale5.4 R-Estimates of Scale1125.5 Asymptotically efficient Scale estimates1145.6 Distributions Minimizing fisher Information for Scale5.7 Minimax Properties116 Multiparameter Problemsin Particular Joint Estimationof Location and scale1256. 1 General remarks1256.2 Consistency of M-Estimates1266.3 Asymptotic Normality of M-Estimates1306. 4 Simultaneous m-Estimates of Location and scale1336.5 M-Estimates with Preliminary Estimates of Scale1376.6 Quantitative robustness of Joint Estimates of Location and Scale 1396.7 The Computation of M-Estimates of Scale14368Studentizing1457 Regression1497. 1 General remarks1497. 2 The Classical Linear Least Squares Case1547. 2.1 Residuals and Outliers1587.3 Robustizing the Least Squares Approach1607.4 Asymptotics of robust regression Estimates163741 The Cases hp2→0 and hp→07.5 Conjectures and Empirical Results1687.5.1 Symmetric Error Distributions1687.5.2 The Question of Bias1687.6 Asymptotic Covariances and Their estimation1707. 7 Concomitant Scale estimates1727.8 Computation of Regression M-Estimates1757.8.1 The Scale Step1767.8.2 The Location Step with Modified residuals1787.8.3 The Location Step with Modified Weights179CONTENTS7.9 The Fixed Carrier Case: What Size hi?1867. 10 Analysis of Variance1907. 11 LI-estimates and Median polish1937. 12 Other Approaches to Robust Regression1958 Robust Covariance and Correlation Matrices1998. 1 General remarks8.2 Estimation of Matrix Elements Through robust Variances2038.3 Estimation of Matrix Elements Through robust Correlation2048.4 An Affinely equivariant approach2108.5 Estimates Determined by Implicit Equations2128.6 Existence and Uniqueness of Solutions2148.6. 1 The Scatter estimate v2148.6.2 The Location estimate t2198.6.3 Joint Estimation of t and y2208.7 Influence Functions and Qualitative robustness2208.8 Consistency and asymptotic normality2238.9 Breakdown Point48.10 Least informative distributions2258.1058. 10.2 Covariance2278.11 Some Notes on Computation2339 Robustness of Design2399.1 General remarks2399.2 Minimax Global Fit9.3 Minimax Slope24610 Exact Finite Sample Results24910.1 General Remarks24910.2 Lower and Upper Probabilities and Capacities25010.2.1 2-Monotone and 2-Alternating Capacities25510.2.2 Monotone and Alternating Capacities of Infinite Order 25810.3 Robust Tests25910.3. 1 Particular Cases26510.4 Sequential Tests267

这是国际上第一本专门介绍宽带波束形成的专著，涵盖了近年来作者在这方面的大部分成果以及一些常用的算法，内容囊括了该方向的几乎所有的参考文献，适合该方向的初学者阅读。

Inside_NAND_Flash_Memories.pdfRino micheloni· Luca Crippa· Alessia marelliInside nand flashMemoriesSpringerRino micheloniLuca CrippaIntegrated Device TechnologyForward InsightsAgrate BrianzaNorth yorkItalCanadarino. micheloni@ieee. orgluca.crippa @ieee.orgAlessia marelliIntegrated Device Technologyagrate brianzaItalylessiamarelli@gmail.comISBN97890-481-9430-8e-ISBN97890-481-9431-5DOI10.1007/978-90-481-9431-5Springer Dordrecht Heidelberg London New YorkLibrary of Congress Control Number: 2010931597O Springer Science+Business Media B.V. 2010No part of this work may be reproduced, stored in a retrieval system, or transmitted in any form or byany means, electronic, mechanical, photocopying, microfilming, recording or otherwise, without writtenbeing entered and executed on a computer system, for exclusive use by the purchaser of the wor Ose ofpermission from the Publisher, with the exception of any material supplied specifically for the purpoCover design: eStudio Calamar SLPrinted on acid-free paperSpringerispartofSpringerScience+businessMedia(www.springer.com)PrefaceIn the last decade Flash cards became the most important digital storage supportIt is difficult to identify a single killer application(digital photography, MP3digital video, ...)or whether the success of this media support is due to itsusability in different applications. It is also difficult to state whether the recentlution in the infotainment area has been triggered by the availability of high-performance NAND Flash memories or if the extraordinary success of Flash cardsis a consequence of the establishment of new applicationsIn any case, independently of the cause-effect relationship linking new digitalapplications and Flash cards, to realize how NANd Flash memories entered in ourdaily life, it is sufficient to imagine as they would change our recent habits if theNAND memories disappeared suddenly. To take a picture it would be necessary tofind a film (as well as a traditional camera .), disks or even magnetic tapes wouldbe used to record a video or to listen a song, and a cellular phone would return tobe a simple mean of communication rather than a console for an extendedentertainmentThe development of nand Flash memories will not be set down on the mereevolution of these digital systems since a new killer application can trigger a furthersuccess for this memory support: the replacement of Hard Disk Drives(HDD)with Solid State Drives (SSD)The advantages of Ssd with respect to HDD are countless(higher read/writspeed, higher mechanical reliability, random access, silent operation, lower powerconsumption, lower weight, .. ) Nevertheless, the cost per gigabyte is stillsignificantly favorable to hDd and the success of ssd will depend only on theperformances that they will succeed in reachingThe present book, the fourth authored by rino micheloni and coworkers afterVLSI-Design of Non-volatiles Memories, Memories in Wireless Systems and ErrorCorrection Codes for Non-volatile Memories, all published by Springer, tacklesall the main aspects related to NANd Flash memories, from the physicaltechnological, and circuit issues to their use in Flash cards and SsdsAfter an extended market overview(Chap. 1), Chap 2 has been conceived as aguide for the entire book, so that the reader can directly reach the heart of theproblems that interest himThe following chapters deepen physical and technological aspects. In particularChaps. 3 and 4 tackle technological and reliability issues of traditional FloatingGate NAND memories, respectively, while the state-of-the-art of charge trappingtechnologies is effectively summarized in Chap 5Ⅴ i PrefaceThe central part of the book is dedicated to circuit issues: logic( Chap. 6),sensing circuits(Chaps. 8 and 9)and high voltage blocks( Chaps. 1l and 12)Other basic topics related to circuit aspects are also analyzed, such as theimplementation of Double Data Rate interfaces( Chap. 7), while multilevel storage(2 bits per cell) is presented in Chap. 10Techniques adopted to increase memory reliability and yield are discussedin Chaps. 13 and 14, the former dealing with redundancy, the latter with ErrorCorrection Codes. The test flux used by nand memories manufactures is describedin Chap 15Chapter 16 focus on nand devices storing 3 and 4 bits per cell that allowreaching the lower cost per gigabyte and that will conquer, in the next few years,the market of consumer applicationsThe last chapters are dedicated to the two most popular systems based onNAND memories: Flash cards( Chap. 17)and SsD(Chap. 18). The relationshipbetween Nand memories and system performances are highlightedFinally, Chap. 19 describes the effects of ionizing radiations on non-volatilememories, to understand whether NaNd memories can be safely used in spaceand military applicationsProf. Piero olivoDean of the Engineering FacultyUniversity of ferrara, ItalyAcknowledgementsAfter completing a project like a technical book, it is very hard to acknowledgeall the people who have contributed directly or indirectly with their work anddedicationFirst of all, we wish to thank all the authors of the contributed chaptersWe have to thank mark de Jongh for giving us the possibility of publishing thiswork and cindy zitter for her continuous supportLast but not least, we keep in mind all our present and past colleagues for theirsuggestions and fruitful discussionsRino. Luca and alessiaTable of contentsPrefaceAcknowledgementsvIII Market and applications for nand Flash memoriesGregory Wong2 NAND overview: from memory to systemsR. Micheloni, A Marelli and S. Commodaro3 Program and erase of Nand memory arrays55Cristoph Friederich4 Reliability issues of NAND Flash memoriesC. Zambelli. a. Chimenton and p. olivo5 Charge trap nand technologies115Alessandro grossi6 Control logic131A Marelli.R Micheloni andR. ravasio7 NAND DDR interface161Andrea silvagni8 Sensing circuits197L. Crippa and R. micheloni9 Parasitic effects and verify circuits235L. Crippa and R. michelonO MLC Storage261L Crippa and R Micheloni11 Charge pumps, voltage regulators and HV switchesR Micheloni and L Crippa

基于opencv的人脸先检测，然后采用分水岭算法进行分割。

【实例简介】ARM+Cortex+M4自学笔记+基于Kinetis K60 对学习cortex M4很有帮助

本文件介绍labview中，如何直接使用调用库函数节点调用c语言的方法。相比公式节点，调用库函数节点，能够使用更复杂的计算。

基于超声波定位的智能跟随小车方案描述，对跟随功能有需要的可以参考一下。

【实例简介】计算广告 良心之所