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测量电子电路设计

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测量电子电路设计模拟篇,觉得讲解得比较深刻,分享给大家图解实用电子技术丛书测量电子电路设计滤波器篇从滤波器设计到锁相放大器的应用「日]远坂俊昭著彭军译钭学出版社北京图字:01-2005-4936号内容简介本书是“图解实用电子技术丛书”之一,也是《測量电子电路设计—模拟篇》的姊妹篇,主要介绍如何从放大了的信号中除去有害噪声,提取有用信号的滤波技术。书中介绍处理低频信号所必需的RC滤波蕃、有源滤波器、C滤波器,以及低频滤波器中能够实现极限Q值的锁相放大器的设计方法等,同时还提供大量的实验数据和模拟数据模拟篇中主要从高轉度信号量的观点,举具体的设计和制作实例详解模拟电路的基本电路,即放大电路。本书的读者对象主要是电子工程技木人员,也可供电子、自动化、仪器仪表等相关专业的师生参考学习。图书在版编目(CIP数据测量电子电路设计:滤彼器篇远坂俊昭著;彭详,北京:科学出版社,2006(图解实用电于技术丛书ISBN7-03-01712-9I.测…Ⅱ.①远…⑨彭…皿.①电子测量-电路设计②港波器设计N.TM930.111-64中国版本图书馆CIP数据核字〔2006)第041385号女编樨:赵方青崔炳哲贲任制作:魏莲责仔印制:刘士平广封面设计:李力共京东方龙盟久有限"司制作-:tp://www.okbuok.conll.cn臀☆服出版」京乐黄城根北街16号郎政编:007lh:tp://www.sciencecon海印射有限责佳公司印刷科学出版社发行各地新华书店经销2006年E月第版开本2006年6月算一次印刷印张:171/4印数:1—4000字数;26200定价:38.00元(如有印装质量问题我社负责调换〈新欣》)刊言本书是《测量电子电路设计—模拟篇》一书的姊妹篇《测量电子电路设计—模拟篇主要着眼于对来自传感器的具有一定S/N的微弱信号电压进行放大的技术。本书的主题则是从放大了的信号中除去有害噪声,提取有用信号的滤波技术无论是由一个电阻和一个电容构成的RC滤波器,还是分析類率高达几十吉赫的炯谱分析器都统称为滤波器,可见其包含的种类和技术非常庞杂木书在介绍应用丁处理频信号的RC滤波器、有源滤波器、LC滤波器,以及低频滤波器中能够实现极限Q值的锁相啟大器〔Iock- in Amplifier)的设计方法的同时,还提供了大量的实验数据和模拟数据。通常关于滤波器的专业书籍,既要颇费力气地阐述理论,又要介绍进行设计时必要的事项。而本书则将重点放在实用设计所必需的技术问题上。这些内容对于直接进行实际设计无疑是非常有用的,只是有关滤波器基础理论的内容相对而言略显单薄。因此书木罗列出参考文献,以供希望进一步深入学习滤波器理论知识的读者参考。要想了解锁相放大器.需要具备一定的锁相环( Phase LockedIoop,PLI)基本知识,不过简明易懂地介绍PIL,中使用的滤波器参数计算方法的专业书籍并不多见。本书对于PLL中使用的滤波器的计算问题,不但在介绍其设计方法的同时还提供大量的实验数据和模拟数据,所以请因PII知识比较欠缺而感到困惑的读者务必阅读这些内容。同时,也向那些对于锁相放大器的使用方法感到困惑的在物理、化学等领域工作的渎者推荐本书。为了熟练地使用测量仪器,必须熟知测量仪器的原理。当进行某种实验时,不仅需要购置正规厂家的测量仪器建立测量系统,还需要自制夹具提高实验准确性和速度。如果任何配件都寄希望于向厂家定做,既花费时间而又未必ⅱ前言合适。请务必阅读本书,学习并掌握自制前置啟大器和滤波器、排除外来噪声的技术,以便能够完成独创性的、质量更高的实验。《测量电子电路设计——模拟篇》和本书都是在CQ出版株式会社董事兼电子电路技术研究会主持人蒲生良治先生的建议下着手编写的ε利用休息日,为进行计算杋模拟而敲键盘,握着电烙铁做作业,原本预定半年完成,结果花了5年的时间。在此,谨向耐心等待迟到稿件的蒲生良治先生和作者的恩师——(株)NF电路设计集团常务董事荒木邦尔先生,以及给予了许多帮助的电子电路技术研究会的各位同仁致以深深的谢意而且,还要向包饺子高手—妻子宏子因怠慢而深表歉意,同时感谢她给予我的支持。著目录第1章概述1.1滤波器的特性与种类……1.1.1各种滤波器—本书介绍频率意义上的滤波器……………………………………11.1.2噪声与滤波器的节宽中中+当甲·甲···鲁中世1.1.3瀌波器对白噪声的滤波效果31.1.4防混浠作用的低通滤波器……………………51.1.5高通瀌波器(HPF)的作用1.1.6带通滤波器(BPF)的作用……1.1.7带阻滤波器(BEF)的作用1.1.8模拟滤波器与数字滤波器1.1.9能够自制的滤波器…………………………101.10由厂家制作的滤波器1.2滤波器的频率响应与时间响应特性■画121.2.1滤波器的阶数与衰减陡度………………121.2.2最大平坦:巴特沃斯特性3.2.3快速调整阶跃响应的贝塞尔特性131.2.4实现陡峭特性的切比雪夫特性141.2.5更加陡峭椭圆( Elliptic)特性151·2.6滤波器的副作馬—对响应特性的影响■■1.2.7髙通滤波器的时间哨应特性…画中b1.2.8带通滤波器的时间啊应特性……………19第2章RC滤波器与RC电路网络的设计…2.1最简单的RC滤波器曾即鲁鲁自·鲁申使费曹鲁啬轟最2.1.1RC低通滤波春的特性2.1.2DC前置放大春上附加RC濾波器222.1.3RC滤波器的多级连接23目录2加深对RC电路网络的印象262.2.1表现电路网络动作的万能曲线2.2.2设时利用渐近线272.2.3高頻截止/低频截止的A万能曲线282.2.4描述相位返回特性的B万能曲线…295PLL电路中应用的高频截止的B万能曲线…302.2.6应用于OP放大器相位补偿的低频截止的B万能曲线第3章有源滤波器的设计373.1概述373.1.1有源湖波器—确定参数值时的自由度高3.1.22阶有源濾波器设计基础3.2有源低通滤波器的设计………403.2.1经掌使用的正反馈型2阶IPF(增益=1)的构成3.2.25阶巴特沃斯LPF的计算例413.2.3使IPF具有放大率的滤波电路3.2.4王反缋型IPF(增益≠1)的构成…433.2.5减小元件灵敏度和失真的多重反愦型LPF…458,2.6有源IPF的高频特性……………………473.3有源高通滤波器的设计……493.3.1正反馈型2阶HPF的构成3.3.25阶切比雪夫HPF的计算例…………………5033.3多重反馈型HHF的构成…3.4状态可调滤波器的设计523.4.1状态可调滤波器的概念翻鲁音垂阝垂垂曲4非省当··垂523.4.2反转型与非反转型在特性上的差别…533.4.3在可变頻率-可变Q的通用滤波器中的应用…573.4.4状恋可调滤波器模块3.4.5低失真率的双截型濾波器583.5带通滤波器的设计…593.5.1将IPF与HPF级联59专栏A状态可调滤波器在低失真率振荡晷中的应用…615.2Q=10以下的1个OP放大器的多重反馈型BPF……………………………623.5.3中心频率为1kHz,Q=5的带通滤波器……633,5.42个放大器的高Q值BPF653.5.5能够用于评价OP故大器噪声的带宽100Hz的BPF………………………663.6带阻滤波器的设计……………………………693,6.1使用BPF的带阻滤波器693.6.2测量失真用的双T陷波滤波器aaaa,了附录有源滤波器设计用的归一化表3第4章LC滤波器的设计794.1LC滤波器概述冒留冒·d中「司自e业宁皇费曲日4.1.1LC滤波器在1ckHz以上的使用价值高4.1.2利用归一表和模拟器使设计变得简单…804.1.3LC滤波器的两种类型………………814.2LC滤波器的设计4.2.1低通LC濾波器的设计…4.2.2归一化表的使黑方法………834.2.3由低通滤波器(LPF)变换为高通滤波器(HPF)8442.4变换为带通滤波罨(BPF)………85专栏B函数台式计算机的应用42.5IPF的带宽越謇响应越慢…………………894.3LC滤波器的实验制作914.31附有5阶低通滤波器的前置放大器………914.3.2巴特沃斯BPF的试制94第5章模拟LC型有源滤波器的设计975.1模拟LC的概念……975.1.1不希望使用线圈甲q曾曹4975.1.2实现FDNR的电路………985.2实用的FDNR滤波器的设计………………985.2.15阶IPF均设计985.2.2特点—不受OP放大器直流漂移的影响…1005.2.3注意最大输入电平1025.2.4信号源电阻为Og的FDNR濾波器…-102目录5,2.5信号源电阻为0Ω的FDNR5阶低通滤波器的试制………10552.6抗误差用7阶切比雪夫滤波春的设汁……108特性的检验1105,2,8利用高速A/D转换器减轻滤波器的负担1125.2.9将电容变换为电感的GIC113第6章滤波器使用的RLC…1176,1滤波器使用的电阻器1176.1.1各种电阻器……176.1.2滤波瘗电路中的金属膜电阻春……………1176.1.3电阻的频率特性……………………1196.2滤波器使用的电容器………………………12⊥6.2,1电容握要注意等效串联电阻Rs…………1216.2,2糈潓波馨中不使用铝电解电容器1246.2.3叠居陶瓷电容器1266.2,4薄膜电容器…………………1286.2,5苯乙烯电容器1306.2.6云母电容器1306.3滤波器使用的线圈1336,3.1线圈的种类和等效电路…………………1336.3.2徵型电感〔圆筒形………………·1356.3.3壶形轶心……………………………1386.3.4用壶形铁心制作电感器的要点……………*1396.3.5基干壶形铁心的100mH电感器的设计…1426.3.5方形金属外壳电感器非着毒看D··晶↓d■,南1456.3.7环形铁心…………………………………14763.8环形铁心电感器的设计例148专栏C关于E系列标准值…………………151第7章变压器对噪声的阻断/抑制作用1537.1变压器概述…………………………………1537.1.1不可轻视变压器的作用…………1537,],2变压器的基本动作…1537.1.3变压器的等效电路154

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    wifi 802.11n 协议标准Contents2. Normative references ........................................................................................................................... 13. Definitions ...........................................................................................................EEE Std802.11n"-2009(Amendment to ieEE Std 802.11-2007as amended by ieee std 802. 11k-2008EEE Std80211r-2008, EE Std802.11y-2008,and IEEE Std 802. 11w-2009)EEE Standard forInformation technology-Telecommunications and informationexchange between systems-Local and metropolitan area networks-Specific requirementsPart 11: Wireless LAN Medium Access Control (MAC)and Physical Layer(PHY SpecificationsAmendment 5: Enhancements for HigherThroughputSponsorLANIMAN Standards committeeof theIEEE Computer SocietyApproved 11 September 2009IEEE-SA Standards boardAbstract: This amendment defines modifications to both the IEEE 802 1 1 physical layer(PHY)andthe IEEE 802 11 medium access control (MAC) sublayer so that modes of operation can be enabledthat are capable of much higher throughputs, with a maximum throughput of at least 100 Mb/s, asmeasured at the Mac data service access point (SAP)Keywords: high throughput, MAC, medium access control, MIMO, MIMO-OFDM, multiple inputmultiple output, PHY, physical layer, radio, wireless local area network, WLANThe Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue New york NY 10016-5997 USACopyright@ 2009 by the Institute of Electrical and Electronics Engineers, IncAll rights reserved. Published 30 October 2009. Printed in the United States of AmericaIEEE is a registered trademark in the U.S. Patent Trademark Office, owned by the Institute of Electrical and ElectronicsEngineers, IncorporatedPDFSBN978-0-7381-60467STD95961Print:|SBN9780-7381-6047-4STDPD95961No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the priorwritten permission of the publisherIEEE Standards documents are developed within the ieee Societies and the standards Coordinating Committees ofthe IEee Standards Association (IEEE-SA) Standards Board. The ieee develops its standards through a consensusdevelopment process, approved by the American National Standards Institute, which brings together volunteersrepresenting varied viewpoints and interests to achieve the final product. Volunteers are not necessarily members of theInstitute and serve without compensation. While the ieee administers the process and establishes rules to promotefairness in the consensus development process, the ieee does not independently evalof any of the information or the soundness of any judgments contained in its standar uate, test, or verify the accuracyUse of an IEEE Standard is wholly voluntary. The ieee disclaims liability for any personal injury, property or otherdamage, of any nature whatsoever, whether special, indirect, consequential, or compensatory, directly or indirectlyresulting from the publication, use of, or reliance upon this, or any other iEFF Standard documentThe ieee does not warrant or represent the accuracy or content of the material contained herein, and expresslydisclaims any express or implied warranty, including any implied warranty of merchantability or fitness for a specificpurpose, or that the use of the material contained herein is free from patent infringement. IEEE Standards docunentsare supplied‘ASIS.The existence of an IEEE Standard does not imply that there are no other ways to produce, test, measure, purchasemarket, or provide other goods and services related to the scope of the ieee Standard. Furthermore, the vintexpressed at the time a standard is approved and issued is subject to change brought about through developments in thetate of the art and comments received from users of the standard. Every ieee standard is subjected to review at leastevery five years for revision or reaffirmation, or every ten years for stabilization. When a document is more than fiverears old and has not been reaffirmed, or more than ten years old and has not been stabilized, it is reasonable toconclude that its contents, although still of some value, do not wholly reflect the present state of the art. Users arecautioned to check to determine that they have the latest edition of any IEEE StandardIn publishing and making this document available, the IEee is not suggesting or rendering professional or othcrservices for, or on behalf of, any person or entity. Nor is the IEEE undertaking to perform any duty owed by any otherperson or entity to another. Any person utilizing this, and any other IEEE Standards document, should rely upon his orher independent judgment in the exercise of reasonable care in any given circumstances or, as appropriate, seek theadvice of a competent professional in deternining the appropriateness of a given IEEE standardInterpretations: Occasionally questions may arise regarding the meaning of portions of standards as they relate tospecific applications. When the need for interpretations is brought to the attention of IEEE, the Institute will initiateaction to prepare appropriate responses. Since IEFF Standards represent a consensus of concerned interests, itimportant to ensure that any interpretation has also received the concurrence of a balance of interests. For this reason,IEEE and the members of its societies and Standards Coordinating Committees are not able to provide an instantresponse to interpretation requests except in those cases where the matter has previously received formal considerationA statement, written or oral, that is not processed in accordance with the IEEE-SA Standards Board Operations Manualshall not be considered the official position of ieee or any of its committees and shall not be considered to be, nor berelied upon as, a formal interprctation of the IEEE. At lectures, symposia, seminars, or educational courses, anindividual presenting information on IEEE standards shall make it clear that his or her views should be considered thepersonal views of that individual rather than the formal position, explanation, or interpretation of the IeEeComments for revision of IEEE Standards are welcome from any interested party, regardless of membership affiliationwith IEEE. Suggestions for changes in documents should be in the form of a proposed change of text, together withappropriate supporting comments. Recommendations to change the status of a stabilized standard should include atonale as to why a revision or withdrawal is required. Comments on standards and requests for interpretations shouldbe submitted to the following addressSecretary, IEEE-SA Standards board445 Hoes lanePiscataway, NJ 08854USAAuthorization to photocopy portions of any individual standard for internal or personal use is granted by The Instituteof Electrical and Electronics Engineers, Inc, provided that the appropriate fee is paid to Copyright Clearance CenterTo arrange for payment of licensing fee, please contact Copyright Clearance Center, Customer Service, 222 RosewoodDrive, Danvers, MA 01923 USA; +1978750 8400 PerImission lo photocopy portions of any individual standard foreducational classroom use can also be obtained through the Copyright Clearance CenterIntroductionThis introduction is not part of IEee Std 802. 11n-2009, IEEE Standard for Information technology-Telecommunications and information exchange between systems--Local and metropolitan networks--Specifirequirements-Part 11: Wireless LAN Medium Access Control(MAC) and Physical Layer(PHY) SpecificationsAmendment 5: Enhancements for Higher ThroughputThis amendment specifies enhancements to IEEE 802. 11 physical layer(PHY)and medium access control(MAC) sublayer to provide modes of operation with useful data rates substantially higher than thosepreviously available. Significantly higher IEEE 802. 11 wireless local area network(WLAN) throughput isexpected to improve user experiences for current applications and to enable new applications and marketsegmentsNotice to usersLaws and requlationsUsers of these documents should consult all applicable laws and regulations. Compliance with theprovisions of this standard does not imply compliance to any applicable regulatory requirementsImplementers of the standard are responsible for observing or referring to the applicable regulatoryrequirements. iEEE does not, by the publication of its standards, intend to urge action that is not incompliance with applicable laws, and these documents may not be construed as doing so on that is not inCopyrightsThis document is copyrighted by the Ieee. It is made available for a wide variety of both public and privateuses.These include both use, by reference, in laws and regulations, and use in private self-regulationstandardization, and the promotion of engineering practices and methods. By making this documentavailable for use and adoption by public authorities and private users, the ieee does not waive any rights incopyright to this documentUpdating of IEEE documentsUsers of ieFF standards should be aware that these documents may be superseded at any time by theissuance of new editions or may be amended from time to time through the issuance of amendments,corrigenda, or errata. 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All rights reservedPatentsAttention is called to the possibility that implementation of this amendment may require use of subjectmatter covered by patent rights. By publication of this standard, no position is taken with respect to theexistence or validity of any patent rights in connection therewith. a patent holder or patent applicant hasfiled a statement of assurance that it will grant licenses under these rights without compensation or underreasonable rates, with reasonable terms and conditions that are demonstrably free of any unfairdiscrimination to applicants desiring to obtain such licenses. Other Essential Patent Claims may exist forwhich a statement of assurance has not been received. The Ieee is not responsible for identifying EssentialPatent Claims for which a license may be required, for conducting inquiries into the legal validity or scopeof Patents Claims, or determining whether any licensing terms or conditions are reasonable or nondiscriminatory. Users of this standard are expressly advised that determination of the validity of any patentrights, and the risk of infringement of such rights, is entirely their own responsibility. Further informationmay be obtained from the ieee Standards associationParticipantsWhen this amendment was sent to sponsor ballot, the IEEe 802. 11 Working Group had the followingofficersBruce P. Kraemer, ChairJon Walter Rosdahl, Vice Chair; Treasurer; and Chair, Task Group mbAdrian P. Stephens Vice chairStephen McCann, Secretary and Chair, Publicity standing Committee and Task group uTerry L. Cole, Technical Editor and Assigned Number AuthorityTeik-Kheong Tan, Chair, Wireless Next Generation Standing CommitteeDavid Bagby, Chair, Architecture Standing CommitteeBruce p. kraemer Co-Chair IMT-Advanced ad hoc commiteeLee armstrong, Chair, Task Group pDonald E Eastlake Ill, Chair;, Task Group sNeeraj Sharna, Chair, Task group lDorothy V. Stanley, Chair, Task Group v and IETF Ad hoc CommitteeJesse Walker, Chair. cTl Ad hoc committeePeter Ecclesine, Chair, Task group yMenzo Wentink, Chair, Task group zGancsh Venkatesan, Chair, Task Group aaEldad Perahia, Chair, Very High Throughput Study groupDarwin Enger, Co-Chair. IMT-Advanced ad hoc committeeWhen this amendment was sent to sponsor ballot, Task Group n had the following officersBruce P Kraemer. chairSILi. vice chairGarth Hillman and Jon Walter Rosdahl, SecretaryAdrian P. Stephens, Technical editorWhen this amendment was sent to sponsor ballot, the IEeE 802. 1l Working Group had the followingmembershiOsama S. aboulmagdMalik audchAmit bansalTomoko adachiCcrt A, awatoJohn. barrAlok aggarwalDavid bagbGal bassonCarlAldanaMichael bahrussa BavafaThomas AlexanderFan baiTuncer BaykasLee r. ArmstrongGabor BaikoJohn L. BenkoAlex ashleyDennis j. bakerMathilde benvenisteCopyright C 2009 IEEE. All rights reservedBiorn A. berkeRobert Y huangChiu ngoDaniel borgesDavid hunterEero nikulaAnthony braskichYasuhiko inoueRichardH. noensJoseph brennanAkio isoHideaki odagiriDavid britzJunghoon JeeJisung OhG. BumillerHongseok JeonChandra s. olsonNancy Cam-WingetYeonkwon JeongYouko omorNecati CanpolatJorjeta G JetchevaSatoshi oyamaJavier cardonaLusheng jiRichard H. PaineDouglas s ChanDaniel JiangAuld. palaniveluClint F. ChaplinPadam AflChangmin ParkCarl W. KainJungsoo parkMinho CheongNaveen K KakanMinyoung ParkMasato katoⅤ ijaykumar PatelNakjungDouglas KanBcminih. peirisLiwen chuRichard H. KennedyEldad perahiaTerry L. ColeJohn KenneJames e. petranovichRyon K. ColemanStuart 3. KerryAl PetrickCharles IJoonsuk kinFahd pirzadaTodor CooklevKyeongpyo KimJames d. portaroXavier p CostaSeong S. kimHenry s. PtasinskiDavid E CypherYongsan KimRene purnadiMarc de courvilleJarkko kneckChang w. PyoRolf J de vegtMark m. kobayashiEmily H QiTheodorus denteneerFumihide KojimaLuke QianJeremy de vriesTom KolzeHuyu QuSusan DickeyBruccp KJim e raabZhiming DingJohannes P KruysⅤ nuth raiYoshiharu doThomas KuehnelAli RaissiniaJohn dorseyThomas m. KuriharaHarish ramamurthyRoger P durandStephen G raymentSrinivasa duvvuriEdwin kwonLeonid razoumovDonald e. eastlakeZhou lanIvan reePeter Ecclesiaejeremy A landtEdward reussMichael ellisJoseph P. lauerAlex reznikStephen P. EmeottTae H. LeeRandal roebuckMarc emmelmannWooyoung leeJon walter rosdahlDarwin EngwerJoseph levyRichard royJoseph epsteinSheung liAlexander safonovⅤ inko ercegPaul linKazuyuki sakodaLars p. falkIlang liuHemanth sampathRobert fanfcllMichael livshitzKatsuyoshi SatoStefan fechterPeter LocHirokazu sawadaPaul h. feinberDaniel lubarDon schultzMatthew FischerAnthony f. maidaYongho SeokWayne k. FisherJakub majkowskiHuairong shaoRoberta fracchiAlastair MalarkyNeeraj sharmaRyuhei FundaJouni K. malinenStephen J ShellhammerMatthew gastAlexander maltsevlan SherlockJames p gilbBill marshallKai shiJeffrey gilbertRoman m. maslennikovShusaku shimadaReinhard GlogerSudheer mattaFrancois simonDavid goodallStephen Mc cannHarkirat SinghTugrul guenerJustin p mcnewGraham K. SmithJianlin gven meseckeMatt smithMark hamiltonRobert r. millerYoo-Seung SongC.J. HanseMichael monteKapil seBrian d. hartRajendra T. moortiVinay SridharaAmer A haHitoshi moriokaDorothy stanleⅤ egard hasselPeter MurrayAdrian P. StephensRobert f heileAndrew milesDavid S Stephenson〔 undo r. HertzRohit nabarCarl R. StevensonJunling hiJohn stineWendong huKengo nagataGuenaelt strutCopyright C 2009 IEEE. All rights reservedChin s SumGanesh VenkateHarry R. worstellEiji TakagiDalton t.Ⅴ ictorPengfei xiaMineo takaiGeorge A. vlantisAkira yamadaTcik-Khcong TanCssc r. walkerTakeshi yamamotoAllan thomsonunlWangmoya yamauraJerry thrasherngEric okuboCraig d. WarrenSu K. YongAlexander TolpinFujio WatanabeSeiji YoshioJason trachewskyPatrick WayeChristopher YoungSolomon b. traininMenzo m. wentinkArtur zaksRichard D. Van NeeFrank whettenHongyuan zhangAllert van zelstKyle williamsHuimin zhangMathieuⅤ arlet-AndmJames worshamJing zhiPrabodh varshneyJuan ZunigaContributions to this amendment was received from the following individualsBill ablⅵ inko ErcegPatrick labbeSantosh abrahamMustafa rozJoseph lauerTomoko adachiStefan fechterDongjun leeDmitry akhmetovPaul feinbergLin-Nan leeCarlos aldanaMatthew fischereeDave andrusGuido frederiksSok-kyu LeeMicha anholtTakashi FukagawaZhongding leiTsuguhide AokiPatrick FungJoseph levyYusuke asarEdoardo gallizioScott leyonhjelGeert awaterJames gardnerPen liDavid BaDevis gattSheung LiRaja banerjeaDavid HedbergYuan liKaberi banerieeGarth hillmanKevin liaoAmit bansalJin-Meng hoIsaac limGal bassonDale hocevarAlfred linAnui batraLouise hooAlbert liuJohn benkoMuhammad akramDer-Zheng liuMathilde benvenisteYasuhiko inoueMichael livshitzBjorn BjerkeKaz ishidaYufei BlakenshipTakashi ishidoshiroPeter LojkoDaniel borgesLakshmi lyerHui-Ling LouDouglas chanEric JacobsonAdina matacheJerry ChangYuh-Ren jauhLaurent mazetJohn ChangTaehyun JeonWilliam mcfarlandJeng-Hong ChenJari JokelaDarren mcnamaraStephen ChenVKJonesIrina medvedevYi-Ming ChenPadam AflArnaud meylanPei-ju ChiangNaveen KakaniMorgan mikFrancois chinSriniavs kandalaSeungwook minWoon Hau ChinAteet KapurPatrick mo上 mily chouAssaf KasherAndy molischLiwen chuMasato katoR. Tushar moortiKeith ChuggJohn KetchumMike moretonBrian ClassonJoonsuk KYuichi moriokaSean CoffeyPansop KimMarkus muckGabriella convertinoYoungsoo KimSyed Aon mujtabaMarc de courvilleGuenter KleindlAndrew mylesRolf de vegtKiyotaka KobayashiRohit nabarFranz dielacherCenk Koselhasa NagaiYoshiharu doiBruce p KraemerKengo NagataJohn deThomas KuehnelSeigo NakaodouglasTakushi KunihiroSanjiv nandaPeter ecclesiaeJoe KwakChiu nDarwin EngwerJoseph kwakAjit NimbalkerLeonid epsteinEdwin kwonGunnar NitscheCopyright C 2009 IEEE. All rights reservedHuaning NiuErik SchylanderRichard van neeIvan oakesMichael sealsNico van waesYoshihiro ohtanilual-Rong ShaoAllert van zelstEric OjardSuman sharmaAndres vila casadoTakeshi onizawaSteve shellhammerGeorgeⅵ lantisJob oostveenIan SherlockTimothy WakeleyFabio osnatoMasaaki shidaJesse walkerKafle padamTakashi shonoBrad wallacePratima paiSebastien SimoensMark wallaceArul palaniveluMassimiliano sitiRod waltonSubra parameswaraDoug SmithQi WThomas pareMatt smithXiaowen WangJean-Noel PatillonAmjadDeric WatersWei-Chung PengRobert staceyMark WebsterEldad perahiaAdrian P. StephensMenzo WentinkJim petranovichRichard WeseKrishna madhavan pillaiVictor StolpmanMike WilhoyteMadhavan pillaiSumei sunTimothy WongAngelo PoloniXiantao sunJames WoodyattNeeraj poojaryShravan surineniHenry ptasinskiIlan sutskoverAriton XhafaAleksandar PurkovicEiji Takagio xiaLuke oianMasahiro takasTomoya YamauraAli RaissiniaSeiichiro TakahashiEric YangSthanunathan ramakrishnanDaisuke takedaWen-Chang YehHarish RamamurthyTeik-Kheong TanChristopher YoungSridhar rameshYasuhiro TanakaHeejung YuRaffaele rivaStephan ten brinkArtur ZaksJon walter rosdahlGanesan ThiagarajanEldad zeiraStephanie Rouquette-LeveilEric OkuboHongyuan zhaMike rudeTim TowellJin ZhangJohn sadowskiJason trachewskyNing ZhangAtul salhotraSolomon traininQuan ZhouVincenzo scarpaDavid tungJohnny ZweigDonald schultzStefano valleJim syrenThe following members of the individual balloting committee voted on this amendment. Balloters may havevoted for approval, disapproval, or abstentionOsama aboulmagdBill cannonSouray duttaTomoko adachiJing CaoRichard eckardAlok AggarwalEdward CarlesCarl EklundThomas alexandeJames CarloStephen emeottRichard AlvinJuan CarreonMarc emmelmannEdward ChalfDarwin EngwcButch AntonDouglas s ChanJoseph epsteinDanilo antonelliKuor-Hsin ChangRobert fanfelleClint ChaplinShahin FarahaniDavid BagbyWei-Peng ChenShulan FengGabor BaikoYung-Mu ChenOddgeir FikstvedtMatthew ballHong ChengMatthew fischerRaja banerjeaAik ChindapoPrince francisVered BKeith ChowAvraham FreedmanJohn barrLiwen ChuDevon gaylePhilip beecherRyon ColemanMichael GeipelMathilde benvenisteCharles cookTheodore Georgantasharry bimsTodor CookiePieter -Paul giesbertsBjorn BjerkeHelge CowardJames gilbMonique brownJoseph decuirReinhard glogerRussell dietzMariana goldhamerWilliam byrdThomas dineenScrgiu gomaPctcr. calderonJohn dorseyDavid goodallCopyright C 2009 IEEE. All rights reserved
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