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PCI Specification 3.0_PCI 3.0 规范

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PCI 3.0 规范,英文原版。PCI Local Bus Specification Revision 3.0PCI LOCAL BUS SPECIFICATION, REV.3.0ContentsPREFACESPECIFICATION.……13INCORPORATION OF ENGINEERING CHANGE NOTICES (ECNS)1查音音鲁垂音音13DOCUMENT CONVENTIONS.………14l. INTRODUCTION…151.1. SPECIFICATION CONTENTS······151.2. MOTIVATION……151.3. PCI LOCAL BUS APPLICATIONS1. 4. PCI LOCAL BUS OVERVIEW171.5. PCI LOCAL BUS FEATURES AND BENEFITS……181. 6. ADMINISTRATION…………………202. SIGNAL DEFINITION m...mn.. 212.1 SIGNAL TYPE DEFINITION222.2. PIN FUNCTIONAL GROUPS..…………222.2.1. System Pins……,…,…,,…,…232.2.2. Address and data pins242.2.3. Interface Control Pins........................252.2.4. Arbitration Pins(Bus Masters Only)272.2.5. Error Reporting Pins....垂看d。普音看鲁D指音着音,。音音自。音音音。音自垂272.2.6. Interrupt Pins( Optional)……282.2.7. Additional signals312.2.8.64- Bit bus extension pins( Optiona)…,,……………………………332.2.9. TAG/Boundary scan Pins(Optional).......342. 10. System Management Bus Interface Pins(Optional)352. 3. SIDEBAND SIGNALS362. 4. CENTRAL RESOURCE FUNCTIONS.····:·····.·············363. BUS OPERATION373.1 BUS COMMANDS373.1. Command definition373. 1.2. Command Usage rules393.2. PCI PROTOCOL FUNDAMENTALS423.2.1. Basic Transfer Control····:············.················433.2.2. Addressing.............143.2.3. Byle lane and Byte enable usage……563.2.4. Bus Driving and Turnaround非音垂垂·非573.2.5. Transaction Ordering and posting….583. 2.6. Combining Merging, and Collapsing。。音垂。音62PCI LOCAL BUS SPECIFICATION, REV.3.03.3. BUS TRANSACTIONS……643.3.1. Read transaction……………653.3.2. Write transaction3.3.3. Transaction termination.………….673.4. ARBItRAtION音垂3.4.1. Arbitration Signaling protoco1..…………………893.4.2. Fast Back-to-Back Transactions. .........................................................93.4.3. Arbitration Parking………………………………………93.5 LATENCY953.5.1. Target Latency…….953.5.2. Master Data latency……….….…….,….….…..……..….,983.5.3. Memory Write Maximum Completion Time limit3.5.4. Arbitration Latency3.6. OTHER BUS OPERATIONS……·。垂,音着垂。着音D。。着。D音着音垂。音着D音非非音垂音非·非1103.6.1. Device selection…....…,103.6.2. Special cycle...........3.6.3. IDSEL Stepping…………,,…,…,,…,,…,,,,,………,…1133.6.4. Interrupt acknowledg3.7. ERROR FUNCTIONS春音·。音垂1153.7.. Parity ger1153.7.2. Parity Checking...........………,163.7.3. Address parity errors…...…,…163.7.4.Error Reporting…17173.7.5. Delayed Transactions and Data Parity Errors.......... 203.7.6. Error Recovery.............,213. 8. 64-BIT BUS EXTENSION1233.8.1. Determining bus Width during System initialization.…….…,1263.9.64- BIT ADDRESSING…..…………………………………………1273.10SPECIAL DESIGN CONSIDERATIONS.1304. ELECTRICAL SPECIFICATION.. m.m.9.1374.1. OVERVIEW…1374.1.1. Transition Road Map……1374.1.2. Dynamic vs Static Drive specificalion…1384.2. COMPONENT SPECIFICATION.……,………………,1…………………1394.2.1. 5V Signaling environment1404.2.2. 33V Signaling environment鲁鲁·垂垂1464.2.3. Timing specification1504.2.4.1determinate Inputs and metastable作,…………1554.2.5. Vendor provided specification..,..…,.…………….………17564.2.6. Pinout recommendation157PCI LOCAL BUS SPECIFICATION. REV.3.04.3. SYSTEM BOARD SPECIFICATION.………1584.3.1. Clock skew,…………………1584.3.2.R··1584.3.3. Pull-ups:····.················:·····…1614.3.4Power1634.3.5. System Timing Budget. ...........1644.3.6. Physical requirements............………674.3.7. Connector Pin assignments……/6844. ADD-IN CARD SPECIFICATION1714.4.1.Add- in Card Pin Assignment..,.,.,………………,1714.4.2. Power Requirements….,.,.,.,.,.,.,,.….,764.4.3. Physical requirements.........1785. MECHANICAL SPECIFICATION1815.1. OVERVIEW1812. ADD-IN CARD PHYSICAL DIMENSIONS AND TOLERANCES...........1825.3. CONNECTOR PHYSICAL DESCRIPTION…………………1954. CONNECTOR PHYSICAL REQUIREMENTS. ...............................2055. CONNECTOR PERFORMANCE SPECIFICATION……………,…2066. SYSTEM BOARD IMPLEMENTATION……………2076. CONFIGURATION SPACEb●看●鲁D鲁0e●2136. 1. CONFIGURATION SPACE ORGANIZATION音垂垂D·垂看垂…2136.2. CONFIGURATION SPACE FUNCTIONS .......................2166.2.1. Device ldentification鲁垂垂2166.2.2. Device Control鲁着鲁D垂2176.2.3. Device status2196. 2.4. Miscellaneous registers·······:········:···:·:··:·:······:··············4······:····2216.2.5. Base addresses……………………….22463. PCI EXPANSION ROMS2286.4. VITAL PRODUCT DATA.2296.5. DEVICE DRIVERS2296.6. SYSTEM RESET.…………………………2306.7. CAPABILITIES LIST2308. MESSAGE SIGNALED INTERRUPTS ...................................................................2316.8.1. MSI Capability Structure..............2326.8.2. MSl-X Capability and Table structures……………….……..2386.8.3. MSI and Msi-X Operation2467. 66 MHZ PCI SPECIFICATION2557. 1. INTRODUCTION2557.2. SCOPE7. 3. DEVICE IMPI TION CONSIDERATIONS7.3.1. Configuration space.......2557. 4. AGENT ARCHITECTURE256PCI LOCAL BUS SPECIFICATION, REV.3.07.5. PROTOCOL.……2567.5.1.66 MHZ ENABLE(M66EN) Pin definition.…………,………,,2567.52Latency..-..-.-2577.6. ELECTRICAL SPECIFICATION……………2577.6.. Overview·.·······.··2577.6.2. Transition roadmap to 66 MHz PCI··········.2577.6.3. Signaling Environment.......... 2587.6.4. Timing specification.……2597.6.5. Vendor provided specification. 26.57.6.6. Recommendations·.·························:············:······:········.:··········2657.7. SYSTEM BOARD SPECIFICATION.………,…,……………2667.7.1. Clock Uncertainty ......2667.7.2. Reset2677.7.3. Pullups..2677.7.4. Power..······.·.·::·····布鲁····音D鲁番。是。音垂看····非D∴2677.7.5. System Timing Budget7.7.6. Physical requirements2687.7.7. Connector Pin assi! nments…..,.,.,..,.,.,..,.,.,2697.8. ADD-IN CARD SPECIFICATIONS春音·。音垂2698. SYSTEM SUPPORT FOR SMBUSn2718. 1. SMBUS SYSTEM REQUIREMENTS2718.1.1. Power………278. 2. Physical and Logical sMBi27l8.1.3. Bus connectivit2728.1.4. Master and slave support....….….…..…..…..,2738.1.5. Addressing and Configuration2738.1.6.Ele2748.1.7. SMBus behavior on Pcl reset.........................2748.2.ADD- IN CARD SMBUS REQUIREMENTS…………2758.2.7Connection2758.2.2. Master and Slave Support...,.…..…….…,...….,2758.2.3. Addressing and Configuration……,…,…,……,…,…,…,….….…..….,2758. 2. 4. Power2758. 2.5. Electrical.········.····························275A. SPECIAL CYCLE MESSAGES●鲁●e鲁277A 1. MESSAGE ENCODINGS277A,2. USE OF SPECIFIC ENCODINGS ................................................277B. STATE MACHINES279B. 1. TARGET LOCK MACHINE·;.···.:..···:...···:··.·:····281B.2. MASTER SEQUENCER MACHINE283B 3. MASTER6PCI LOCAL BUS SPECIFICATION. REV.3.0C. OPERATING RULES289C 1. WHEN SIGNALS ARE STABLE..·····.:·.·.::···:·;289C.2. MASTER SIGNALS…音·。·看290C.3. TARGET SIGNALS…291C.4. DATA PHASES…292C.5. ARBITRATION.……………………………………292C.6. LATeNCY······:“·······293C.7. DEVICE SELECTION……………,……………………………293C 8. PARITY垂垂垂D·垂294D. CLASS CODESD 1. BASE CLASS OOH...w.w...296D 2. BASE CLASS OlH296D. 3. BASE CLASS O2H··297D 4. BASE CLASS O3H297D.5. BASE CLASS04H.………………………298D. 6. BASE CLASS OSH298D.7. BASE CLASS06H...………….…………………299D 8. BASE CLASS OZH,300D 9. BASE CLASS OSH.301D.10. BASE CLASS C9H.……………………………………………….301D.11. BASE CLASS OAH.…………………302D 12. BASE CLASS OBH302D. 13. BASE CLASS OCH303D.14. BASE CLASS ODH….…304D. 15. BASE CLASS OEH304D. 16. BASE CLASS OFH·····.····;····:·;:·······304D.17. BASE CLASS JOH.……………………………………………1305D, 18. BASE CLASS 11H305E. SYSTEM TRANSACTION ORDERINGE.I. PRODUCER- CONSUMER ORDERING MODEL308E. 2. SUMMARY OF PCI ORDERING REQUIREMENTS310E.3. ORDERING OF REQUESTS........................................311E.4. ORDERING OF DELAYED TRANSACTIONS…………312E.5. DELAYED TRANSACTIONS AND LOCK#.317E.6. ERROR CONDⅠ TIONS……318. EXCLUSIVE ACCESSES..m.msn0..319F.1. EXCLUSIVE ACCESSES ON PCIF 2. STARTING AN EXCLUSIVE ACCESS321F.3. CONTINUING AN EXCLUSIVE ACCESS323F 4. ACCESSING A LOCKED AGENT324F 5. COMPLETING AN EXCLUSIVE ACCESS325F. 6. COMPLETE BUS LOCK ......................................................................325IO SPACE ADDRESS DECODING FOR LEGACY DEVICES..9.... 327PCI LOCAL BUS SPECIFICATION, REV.3.0CAPABILITY IDS。,0329I. VITAL PRODUCT DATA331VPD FORMAT3I.2COMPATIBILITY……………………………334L.3. VPD DEFINITIONS3341.3.1. VPD Large and small resource Data Tags......·D垂看3341.3.2. VPD Example…3378PCI LOCAL BUS SPECIFICATION. REV.3.0FiquresFIGURE -I: PCI LOCAL BUS APPLICATIONS春DFIGURE 1-2: PCI SYSTEM BLOCK DIAGRAM17FIGURE2-1: PCI PIN LIST.…………..…………21figure 3-1: ADDRESS PHASE FORMATS OF CONFIGURATION TRANSACTIONS...... 48Figure 3-2: LAYOUT OF CONFIG ADDRESS REGISTER, ..............................................50Figure 3-3: HOST BRIDGE TRANSLATION FOR TYPE O CONFIGURATION TRANSACTIONSADDRESS PHASE51FIGURE3-4: CONFIGURATION READ…………156FIGURE3-5: BASIC READ OPERATION………………………65FIGURE 3-6: BASIC WRITE OPERATION66FIGure 3-7: MASTER INITIATED TERMINATION........................ 68FIGURE3-8: MASTER- ABORT TERMINATION…………69Figure 3-9: RETRY. ..........................................................................................................73FiGure 3-10: DISCONNECT WITH DATA. ........................74FiGure 3-11: MASTER COMPLETION TERMINATION:·:····:··.·4····.···…75FiGURE 3-12: DISCONNECT-1 WITHOUT DATA TERMINATION·····76Figure 3-13: DISCONNECT-2 WITHOUT DATA TERMINATION76FiGure 3-14: TARGET-ABORT…177figure 3-15: BASIC ARBITRATIONFIGuRE 3-16: ARBITRATION FOR BACK-TO-BACK ACCESS…94FiGurE 3-17: DEVSEL# AsSERTION·····:···.·:··110Figure 3-1 8: IDSEL STEPPING114FiGure 3-19: INTERRUPT ACKNOWLEDGE CYCLE. ...................................................114FIGURE3-20: PARITY OPERATION………116FIGuRE 3-21: 64-BIT READ REQUEST WITH 64-BIT TRANSFER125FIGURE 3-22: 64-BIT WRITE REQUEST WITH 32-BIT TRANSFER..........126FIGURE 3-23 64-BIT DUAL ADDRESS READ CYCLE129FIGURE 4-1: ADD-IN CARD CONNECTORS...........................138FIGURE4-2:V/ICURⅤ ES FOR5 V SIGNALING.…………………143FIGURE 4-3: MAXIMUM AC WAVEFORMS FOR 5V SiGnaling145FIGURE 4-4: V/I CURVES FOR 3.3V SIGNALING148FIGURE4-5:MAⅹ IMUM AC WAⅤ EFORMS FOR3.3ⅴ SIGNALING………150FIGURE 4-6: CLOCK WAVEFORMS151FIGURE 4-7: OUTPUT TIMING MEASUREMENT CONDITIONS.··4·:······.·154FIGURE4-8: INPUT TIMING MEASUREMENT CONDITIONS…………154FIGURE 4-9: SUGGESTED PINOUT FOR POFP PCI COMPONENT···“···:.···.····:·········157FIGURE4-10: CLOCK SKEW DIAGRAM………158FIGURE 4-1: RESET TIMING16lFIGURE4-12: MEASUREMENT OF TPROP,3.3 VOLT SIGNALING……………166FIGURE 5-1: PCI RAW ADD-IN CARD(3.3V, 32-BIT).183FIGURE 5-2: PCI RAW VARIABLE HEIGHT SHORT ADD-IN CARD(3.3V, 32-BIT)..........184FIGURE 5-3: PCI RAW VARIABLE HEIGHT SHORT ADD-IN CARD(3.3V, 64-BIT)....185FIGURE 5-4: PCI RAW LOW PROFILE ADD-IN CARD(3.3V, 32-BIT)..........186PCI LOCAL BUS SPECIFICATION, REV.3.0FIGURE5-5: PCI ADD-Ⅰ N CARD EDGE CONNECTOR BEⅤEL……187FIGURE56: PCI ADD-IN CARD ASSEMBLY(3.3V)……………………………88FIGURE 5-7: LOW PROFILE PCI ADD-IN CARD ASSEMBLY 3.3V)189FIGURE 5-8: PCI STANDARD BRACKET………190FIGuRE 5-9: PCI LOW PROFILE BRACKET191FIGURE 5-10: PCI STANDARD RETAINER···192FIGURE5-11: IO WINDOW HEIGHT∴………………193FIGURE 5-12: ADD-IN CARD INSTALLATION WITH LARGE IO CONNECTOR.......194FIGURE 5-13: 32-BIT CONNECTOR196FIGURE 5-14: 3.3V/32-BIT CONNECTOR LAYOUT RECOMMENDATION. ........................197FIGURE5-15:3.3V/64-BIT CONNECTOR198FIGURE 5-16: 3.3V/64-BIT CONNECTOR LAYOUT RECOMMENDATION 199FIGURE 5-17: 3.3V/32-BIT ADD-IN CARD EDGE CONNECTOR DIMENSIONS ANDTOLERANCES2(垂D·。垂,音着垂。着音D。。着。D音着音垂。音着音FIGURE 5-18: 3.3V/64-BIT ADD-IN CARD EDGE CONNECTOR DIMENSIONS ANDTOLERANCES….201FIGURE5-19: UNIVERSAL 32-BIT ADD-IN CARD EDGE CONNECTOR DIMENSIONS ANDTOLERANCES………………………………202FIGURE 5-20: UNIVERSAL 64-BIT ADD-IN CARD EDGE CONNECTOR DIMENSIONS ANDTOLERANCES203FIGURE5-21:PCⅠADD- IN CARD EDGE CONNECTOR CONTACTS……204FIGURE5-22: CONNECTOR CONTACT DETAIL………………205FIGURE 5-23: PCI CONNECTOR LOCATION ON SYSTEM BOARD208FIGURE5-24:32- BIT PCI RISER CONNECTOR……209FIGURE 5-25: 32-BIT/3.3V PCI RISER CONNECTOR FOOTPRINT210FIGURE 5-26: 64-BIT/3.3V PCI RISER CONNECTOR211FIGuRE5-27:64-BI/3.3ⅴ PCI RISER CONNECTOR FOOTPRINT∴………212FIGURE 6-1: TYPE OOH CONFIGURATION SPACE HEADER215FIGURE 6-2: COMMAND REGISTER LAYOUT217FIGURE6-3: STATUS REGISTER LAYOUT……………………………219FIGURE 6-4: BIST REGISTER LAYOUT222FIGURE 6-5: BASE ADDRESS REGISTER FOR MEMORY........... 225FIGURE 6-6: BASE ADDRESS REGISTER FOR L/O225鲁着D音看FIGURE 6-7: EXPANSION ROM BASE ADDRESS REGISTER LAYOUT.....,..... 228FIGURE6-8: EXAMPLE CAPABILITIES LIST…….231FIGURE6-9: MSI CAPABILITY STRUCTURES…..……233FIGURE 6-10: MSI-X CAPABILITY STRUCTURE238FIGurE 6-11: MSI-X TABLE STRUCTURE翻音。音239FIGurE 6-12: MSI-X PBA STRUCTURE…239FIGURE 7-1: 33 MHZ PCI VS 66 MHZ PCI TIMING······:··················257FIGURE7-2:3.3 V CLOCK WAVEFORM.…………259FIGURE 7-3: OUTPUT TIMING MEASUREMENT CONDITIONS263FIGURE -4: INPUT TIMING MEASUREMENT CONDITIONS263FIGURE75:TvAL(MAX) RISING EDGE…………264FIGURE 7-6: TVAL(MAX) FALLING EDGE·265FIGURE77:TVAL(MIN) AND SLEW RATE……26510

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  • ISO16750-3-2012
    ISO16750-3-2012Road vehicles — Environmentalconditions and testing for electricaland electronic equipment —Part 3:Mechanical loadsContents PageForeword.............................................................................................................................................Iso16750-3:2012[EContentsPageForewordScope12Normative references1Terms and definitions4Tests and requirements4.1ibration4.2 Mechanical shock274.3 Free fall…294.4 Surface strength/ scratch and abrasion resistance294.5 Gravel bombardmentCode letters for mechanical loads29Documentation…,…………111111130Annex A (informative) Guideline for the development of test profiles for vibration tests.32Annex B (informative) Recommended mechanical requirements for equipment depending on themounting location44Bibliography46C ISO 2012-All rights reservedIso16750-3:2012EForewordISo (the International Organization for Standardization) is a worldwide federation of national standardsbodies (Iso member bodies). The work of preparing International Standards is normally carried outthrough iso technical committees. Each member body interested in a subject for which a technicalcommittee has been established has the right to be represented on that committee. Internationaorganizations, governmental and non-governmental, in liaison with ISO, also take part in the workIso collaborates closely with the International Electrotechnical Commission (IEC) on all matters ofelectrotechnical standardizationInternational Standards are drafted in accordance with the rules given in the ISo/IEC Directives, Part 2The main task of technical committees is to prepare lnternational standards. draft InternationalStandards adopted by the technical committees are circulated to the member bodies for votingublication as an International Standard requires approval by at least 75 of the member bodiescasting a voteAttention is drawn to the possibility that some of the elements of this document may be the subject ofpatent rights. ISO shall not be held responsible for identifying any or all such patent rightsIso 16750-3 was prepared by Technical Committee ISO/TC 22, Road vehicle, Subcommittee SC 3,Electrical and electronical equipment.This third edition cancels and replaces the second edition (Iso 16750-3: 2007), which has beentechnically revisedISo 16750 consists of the following parts, under the general title road vehicles-Environmental conditionsand testing for electrical and electronic equipment:Part 1: GeneralPart 2: electrical loadsPart 3: Mechanical loadsPart 4: Climatic loadsPart 5: chemical loadso ISO 2012-All rights reservedINTERNATIONAL STANDARDIso16750-3:2012(E)Road vehicles- Environmental conditions and testing forelectrical and electronic equipmentPart 3Mechanical loads1 ScopeThis part of IS0 16750 applies to electric and electronic systems/components for road vehicles. Itdescribes the potential environmental stresses and specifies tests and requirements recommended forthe specific mounting location on/in the vehicleThis part of iso 16750 describes mechanical loads2 Normative referencesThe following referenced documents are indispensable for the application of this document. For datedreferences, only the edition cited applies For undated references, the latest edition of the referenceddocument (including any amendments applies.Iso16750-1, Road vehicles- Environmental conditions and testing forelectrical andelectronicequipment-Part 1: GeneralIEC 60068-2, 6, Environmental testing- Part 2-6: Testing, Test Fc: Vibration SinusoidalIEC60068-2, 14, Basicenvironmental testing procedures- Part 2-14: Tests-Test Nb: Change oftemperatureTEC 60068-2, 64, Environmental testing Part 2-64: Test methods -Test Fh -Vibration, broad-bandrandom(digital control)and guidanceIEC 60068-2, 80, Environmental testing- Part 2-80: Tests- Test Fi: Vibration - Mixed mode testingIEC 60068-2-31, Environmental testing procedures- Part 2: Tests; Test Ec: Free fall, Clause 5.23 Terms and definitionsFor the purposes of this document, the terms and definitions given in Iso 16750-1 app4 Tests and requirements4.1 Vibration41.1 GeneralThe vibration test metho ds specified consider various levels of vibration severities applicable to on-board electrical and electronic equipment. It is recommended that the vehicle manufacturer andsupplier choose the test method, the environmental temperature and vibration parameters dependingon the specific mounting locationFollowing the expressions in MIL-STD please noticeC ISO 2012-All rights reservedIso16750-3:2012EWhen applied properly, the environmental management and engineering processes described in this partof Iso 16750 can be of enormous value in generating confidence in the environmental worthiness andoverall durability. However, it is important to recognize that there are limitations inherent in laboratorytesting that make itimperative to use proper caution and engineering judgement when extrapolating theselaboratory results to results that may be obtained under actual service conditions. In many cases, realworld environmental stresses (singularly orin combination cannot be duplicated practically or reliably intestlaboratories. Therefore, users of this part of Iso 16750 should not assume that a system or componentthat passes laboratory tests of this part of Iso 16750 would also pass field/ fleet verification trialsThe specified values are the best estimation one can get up to the moment when results frommeasurements in the car are received - but they do not replace a car measurement!The specified values apply to direct mounting in defined mounting locations. Using a bracket formounting can resultin higher or lower loads. If the device under test ( DUT)is used in the vehicle with abracket then all vibration and mechanical shock test shall be done with this bracketCarry out the vibration with the dut suitably mounted on a vibration table. The mounting method (sused shall be noted in the test report. Carry out the frequency variation by logarithmic sweeping of 0,5octave/minute for sinusoidal tests and the sinusoidal part of sine on random tests. The scope of therecommended vibration tests is to avoid malfunctions and breakage mainly due to fatigue in the fieldTesting for wear has special requirements and is not covered in this part of ISo 16750Loads outside of the designated test frequency ranges are to be considered separatelNOTE Deviations from the load on the DUT can result, should vibration testing be carried out according tothis part of Iso 16750 on a heavy and bulky dut, as mounting rigidity and dynamic reaction on the vibrator tableexcitation are different compared to the situation in the vehicle. This deviation can be minimized by applying theaverage control method(see Annex A)Application of the weighted average control method according to IEC 60068-2, 64 is to be agreed uponSubject the dut during the vibration test to the temperature cycle according to iEC 60068-2, 14, withelectric operation according to diagram 1. Alternatively, a test at constant temperature may be agreed onOperate the dutelectrically as indicatedin Figure l at Tmin(Short functional testafterthe dUT completelyreached Tmin). This functional test shall be as short as possible- only long enough to check the properperformance of the dUt. This minimizes self-heating of the dUT. Additional electrical operation of theDUT between 210 min and 410 min of the cycle (see Figure 1)Additional drying of test chamber air is not permittedIn the vehicle, vibration stress can occur together with extremely low or high temperatures; for thisreason, this interaction between mechanical and temperature stress is simulated in the test, too. afailure mechanism is, for example, a plastic part of a system/component, which mellows due to the hightemperature and cannot withstand the acceleration under this condition2o ISO 2012-All rights reservedIso16750-3:2012[EYmax20aburditt0100200300400500600yY temperature[°C]x time [ minIa Operating mode 3.2 according to ISo 16750-1.b Operating mode 2. 1 according to ISo 16750-1One cycleFigure 1-Temperature profile for the vibration testTable 1- Temperature versus time for the vibration testTimeTemperaturemin°C0206040150-4021020300max41048020See Is016750-44.1.2 Tests4.1.2.1 Test I- Passenger car, engine4.1.2.1.1 PurposeThis test checks the dUt for malfunctions and breakage caused by vibrationThe vibrations of a piston engine can be split up into two kinds: Sinusoidal vibration which results from theunbalanced mass forces in the cylinders and random noise due to all other vibration-schemes of an engine,C ISO 2012-All rights reserved3Iso16750-3:2012Ee.g. closing of valves. In the lowest frequency range from 10 Hz to 100 Hz the influence of rough-roadconditions is taken into account. The main failure to be identified by this test is breakage due to fatigueNOTE 1 Road profile usually has negligible impact on engine-mounted components. Shock inputs are effectivelysolated by suspension, and engine-mounting systemsThe test profiles specified in the following clauses apply to loads generated by(four strokereciprocating enginesNotE 2 If the dut is to be tested for a specific resonance effect, then a resonance dwell test according to 8.3.2of IEC 60068-2, 6: 2007 can also be applied4.12.1.2Test4.1.2.1.2.1 GeneralIt is required to perform this test as a mixed mode vibration test according to IEC 60068-2, 80NOTE The test duration is based on A 4. The temperature in the chamher is above room temperature (rt)atthe end of the test (2 3/4 temperature cycles4.1.2.1.2.2 Sinusoidal vibrationPerform the test according to IEC 60068-2, 6, but using a sweep rate of s 0,5 octave/minute. Use a testduration of 22 h for each plane of the dUTUse curve l in Table 2/ Figure 2 for DUT intended for mounting on engines with 5 cylinders or fewerUse curve 2 in Table 2/Figure 2 for dUT test intended for mounting on engines with 6 cylinders or moreBoth curves may be combined to cover all engine types in one test2502001501005050100150200250300350400450500ⅩKeyamplitude of acceleration [m/s2IXfrequency [Hzcurve1(≤5 cylinders)curve 2(5 cylindersFigure 2- Vibration severity curves4o ISO 2012-All rights reservedIso16750-3:2012[ETable 2- values for max acceleration versus frequencyCurve 1(see Figure 2FrequencyAmplitude of accelerationHz100100200200240200270100440100Curve 2(see Figure 2)FrequencyAmplitude of accelerationHm/s2100100150150440150CombinationFrequencyAmplitude of accelerationH1001001501502002002402002551504401504,1.21.2.3 Random vibrationPerform the test according to IEC 60068-2, 64. 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