自行开发的51单片机电子钟程序，且带有上位机通讯的功能。

使用GPTC6604做的一个录放音DEMO，数据存储在外部SPI FLASH-GPTC6604 make use of an audio recording DEMO, data stored in the external SPI FLASH

upsd3200_adc.c upsd3200_lcd.c upsd3200_pwm.c upsd3200_timer.c uPSD的实用程序-upsd3200_adc.c upsd3200_lcd.c upsd3200 _pwm.c upsd3200_timer.c uPSD practical procedures!

单片机IO口模拟UART演示程序，使用74HC164串行显示数据-Single-chip analog IO port UART demo program, the use of 74HC164 serial display data

AVR单片机的BLDC无位置传感器控制的程序源码-AVR Microcontroller BLDC sensorless control program source code

* 硬件结构： PA0-5对应６个ＬＥＤ数显管的位 ，PC0-7对应各ＬＥＤ数显管的段 ，PB4-7为键盘。 * 软件描述： 上电后，时钟从00.00.00（时/分/秒）自动走时，在走时状态时 ， 按PB4（设定 * 键）超过3秒可循环选择调整时间/工作参数 ，接着按PB5以确定选择的操作 ，进入调整操作后 ， * 按PB5选择欲调整参数，按PB6（增加键）完成调整参数操作 。按PB7，进入时控运行，PB1亮， * 再按PB7停止时控运行，回显走时。在定时到时，PB0点亮。- * Hardware architecture: PA0-5 corresponds 6 LED numbers to reveal the tube the position, PC0-7 corresponds each LED number to reveal the tube the section, PB4-7 is a keyboard. * Software description: After on electricity, clock from 00.00.00 (when/a minute/second) is in luck automatically, when is in luck the condition, according to PB4 (hypothesis * The key) surpasses for 3 seconds to be possible to circulate the choice time/operational parameter, then presses PB5 by to determine the choice the operation, after enters the adjustment operation * Wants according to the PB5 choice to adjust the parameter, (increases key) according to PB6 to complete the adjustment parameter operation.According to PB7, enters when controls the mov

modbus 通讯程序 物理层rs-485-Modbus communication procedures rs-485 physical layer

一个简单的利用查表法的反正切和正、余弦函数，在处理速度不快的单片机编程中，这是一个使用的方法。-The use of a simple arctangent look-up table method and positive, cosine function, the processing speed of microcontroller programming unpleasant, this is a method used.

CodevisionAVR 开发环境。 用AVR控制TI/Chipcon非常常用的CC1000射频收发芯片。 -CodevisionAVR development environment. AVR control with TI/Chipcon CC1000 very common RF transceiver chip.

LPC单片机读写EEPROM程序-LPC SCM reader EEPROM process

winbond的w77e58双串口测试-the dual serial test