CF卡转换成IDE标准接口的电路图，个人的意见可供大家参考

条形电子屏的源代码，使用keil c51编译。-strip electronic screen source code, the use of c51 Keil compiler.

avr32通过定时器0＼2的ＰＷＭ来调整t6963对比及背光电平。-mega32 contral de voltage for background etc.,through TIMER0 and TIMER2 using PWM

单片机C51控制，实时时钟程序，单片机掉电后重新启动仍能准确显示时间-C51 single-chip control, real-time clock procedures, single-chip power-down after the restart time can accurately show

at2051中实现AD转换的源代码！也算是一个实例程序。-at2051 realizes the source code which AD transforms! Also is an example procedure.

1602lcm字符液晶屏驱动演示程序,连接线图: LCM-------51 LCM-------51 LCM--------51 DB0-----P0.0 DB4-----P0.4 RS-------P2.0 DB1-----P0.1 DB5-----P0.5 RW-------P2.1 DB2-----P0.2 DB6-----P0.6 E--------P2.7 DB3-----P0.3 DB7-----P0.7 VLCD接1K2电阻到GND [注]:AT89C51的晶振频率为12MHz-1602lcm character LCD Driver demo program, link map : LCM LCM------- 51------- 51-------- 51 DB0 LCM P0 .0 DB4----------------- P2.0 P0.4 RS DB1----- P0 .1 DB5 P 0.5 RW----------------- P P2.1 DB2 Encl 0.2 DB6 E------------------ P0.3 P2.7 DB3 DB7----- P0.7 VLCD access 1K2 resistance to GND [Note] : AT89C51 oscillator frequency of 12 MHz

一个电子产品开发时的部分c代码E!绝对能用!-When an electronic product development part of c code E! Absolutely can!

介绍了集成温度传感器AD590，给出了AD590测量热力学温度、摄氏温度、两点温度差、多点最低温度、多点平均温度的具体电路，并以节能型温、湿度控制系统为例介绍了利用AD590测两点温差电路的应用。-Introduced an integrated temperature sensor AD590, given AD590 measuring thermodynamic temperature, Celsius temperature, two temperature difference, multi-point minimum temperature, average temperature of the specific multi-point circuits, and to energy-efficient temperature and humidity control system as an example, introduced the use of two AD590 temperature measurement circuit applications.

本程序使用AduC812单片机,实现从键盘读取数字,并用LED指示灯显示按键所在行列数-the procedures used Aduc812 Microcontroller microcontroller, read from a digital keyboard and LED indicator shows where the ranks of a few buttons

液晶19264驱动程序。用MSP430F149控制，经过调试成功-19,264 LCD driver. With MSP430F149 control, after successful testing

can-汇编测试程序，适用于单片机的can模块测试-can-compilation testing procedures can apply to single chip module testing