DSG

An E-BOOK on OFDM basics and PAPR reduction Techniques

利用单元平均CFAR门限以及单元平均选大CFAR来实现信号的频谱搜索(Using cell average CFAR threshold and average unit chosen CFAR to realize the signal spectrum search )

AB公司的ContolLogix 5000软件控制系统编程实例！(AB ContolLogix 5000 software control system programming examples!)

说明：  matlab中做层次分析的有关程序，用的最通行的算法，即矩阵的运算(AHP matlab to do about the procedure, the most prevalent method used, the matrix operation)

多电平差错概率在同一张图上仿真多幅度电平PAM在M=2,4,8，16时符号的差错概率，信噪比0:25(Multi-level error probability)

射线追踪,包含了起点和终点的射线函数，对于地震传播研究具有重要意义！(Raytracing in a v(z) world. The toolbox contains functions forshooting fans of rays and functions for tracing rays with specific start and end points. General multi-bounce rays with any number of mode conversions can be traced. Automatic routines for P-P and P-S primaries in shot-gather geometry are provided for convenience. Any recording geometry can be used but most functions vectorize (e.g. are most efficient) for shot-gather geometry. Only traveltimes and rayparameters are detemined, not amplitudes. In these routines, the velocity models should be considered as "background" models. This means that the depths at which flections and mode conversions occur are dependent of the depths given as layer boundaries in the velocity models. Velocity models are specified by a vector of velocities and a same-size vector of depths. The j th velocity is in effect from the j th to the j+1 th depth. The bottom of the model is assumed at infinite depth. Thus v=5000 and z=0 specifies a cons)

自适应控制方面的经典书籍，仅供学习研究参考用，不得违规(Adaptive control of classic books)

这是一个进行卫星轨道预报的程序。导航卫星；自主轨道预报；状态转移矩阵。无错误(This is a satellite orbit prediction program. Navigation Satellite autonomous orbit prediction state transition matrix. No error)

q730是模拟低通转换为数字低通.q731是切比雪夫滤波器设计，q732椭圆带通数字滤波器的设计，其中用的是ellipord函数(q730 is converted to analog low-pass digital low-pass. q731 is a Chebyshev filter design, q732 elliptical band-pass digital filter design, which is used in a function ellipord)

SILICON WAFER DEFECT DETECTION An automated system developed for defect analysis and reporting of defects in a semiconductor wafer