DNF64位最新源码

应用标记符控制分水岭分割 有效解决了分水岭算法在图像分割中的过分割问题

BMS 主控板代码，可以找到有用的模块参考，个国内电池管理系统(bms)的源码，主机用的是XC2287M,解决方案C语言程序源码 有电压、电流等采集方案源代码

Rohde&Schwarz 频谱仪操作手册（英文） 1145.5850系列全英文，详细的操作方式，各类使用技巧R&S FSHContentsContentsSpecificationsSafety InstructionsCertificate of qualitEC-Certificate of conformitySupport Center AddressList of R&S RepresentativesPutting into OperationFront view1.1Putting into Operation1.2Unpacking the Instrument1.2Setting up the InstrumentSwitching on the Spectrum Analyzer1.4Spectrum Analyzer Connectors1.5Screen SettingsQCountry-Specific Settings1.10Setting the Date and TimeSetting the date.1.11Setting the time1.1Charging the Battery......1.12Selecting the Instrument Default Setup1.13External Reference /External Trigger Switchover1.14Controlling the rF Attenuator1.15Using a Preamplifier…1.15PIN Entr1.17Connecting Printers.1.19Setting the Baud rate for Remote Control1.21Enabling Options1.21Checking the Installed options1.221145.5973.12E-15ContentsR&S FSH2 Getting Started2.Measurements on cw signals2.1Level measurement2Setting the Reference Level量‘面2.2Frequency Measurements2.3Harmonic Measurements of a sinewave Signal面面2.4Power Measurements Using the Power Sensor2.5Power and return loss measurements with the r&s FsH-z14 or the r&s FSH-Z444427Two-Port Transmission measurements2.9Measurement of return loss2.11Performing Distance-To-Fault Measurements...2.14Operation in Receiver Mode2.20Measuring the carrier-to-Noise power ratio2.Determining the Reference2.26Sts…2.26Selecting the reference channel2.27Entering the channel bandwidth of the reference channel2.27Selecting the unit for the reference...2.27Manually entering the reference2.27Automatic level adjustment2.27Measuring the Noise Power and Calculating Carrier Power /Noise Power.........2.28Selecting the result display2.28Frequency setting of the noise channel..2.28Setting the noise channel measurement bandwidth2.29Setting the C/N channel bandwidth2.29Automatic level adjustment2.29Correcting the displayed average noise level2.30Hiding the result display2.30Saving and Recalling Settings and Test Results2.31Saving Measurement Results2.31Saving Calibration Data2.32Recalling measurement results2.33Printing Out Measurement Results……2.341145.5973.122E-15R&S FSHContents3 Operation3.Screen LayoutScreen layout for spectrum-mode measurements without markers3.1Screen layout when the marker mode is selected3.2Entering Measurement ParametersEntering values and texts3.3Entering units3.4Menu overview.3.5Frequency entryFrequency span...Level setting…3.5Bandwidth settingTrace setting3.6Measurement functions3.7Marke3.10Save and print menu3.12Instrument setup3.12Status display3.12Menus in the Receiver Mode(option R&S FSH-K3)3.13Menu for 3GPP BTS Code domain Power Measurement (Option R&S FSH-K4)3.16Menu for Vector Voltmeter(Option R&S FSH-K2)3.161145.5973.12E-15ContentsR&S FSH4 Instrument functions4Instrument Default Setup4.1Status Display..................4.1Setting the Frequency4.2Entering the center frequency..4.2Setting a frequency offset4.2Entering the center-frequency step size4.3Entering the start and stop frequency4.4Working with channel tablesSetting the Span1面4.6Setting the Amplitude Parameters4.7Setting the reference levelEntering the display range94.9Entering the display unit4.9Entering the reference offset4.10Entering the input impedance.…………4.10Setting the Bandwidths4.11Resolution bandwidth4.11Video bandwidth4.13Setting the Sweep4.14Sweep time.4.15Sweep mode.4.15Trigger4.16Trace Settings4.19Trace mode∴4.19Detector4.20Trace memory…4.22Trace mathematics4.23Using the Markers4.24Automatic marker positioning .......4.25Using more than one marker at a time(multimarker mode).........,4.27Marker functions4.30Measuring the noise power density4.30Measuring the frequency4.31Measuring the filter bandwidth or the signal bandwidth4.32aF demodulation4.331145.5973.12E-15R&S FSHContentsUsing the dis play line…….….….….….….….….….…..….….……….…..34Setting and Using the Measurement Functions4.35Measuring the channel power of continuously modulated signals………………4.35Selecting the standard4.36Setting the reference level4.38Setting the channel bandwidth4.38Changing the spaPower displaPower measurements on TDMA signals4.42Selecting a standard∴4.42Setting the measurement time4.44Optimizing the reference level ..4.44Power readout4.45Setting the trigger4.45Measuring the occupied bandwidth4.46Selecting a standard4.47Setting the reference level4.48Setting the channel bandwidth4.49Entering the power percent to determine the occupied bandwidth4.50Displaying thupied bandwidth4.50Changing the spai1145.5973.12E-15ContentsR&S FSHMeasuring the Carrier-to-Noise Ratio.......4.52Determining the reference4.53Setting the reference channel4.53Setting the reference channel bandwidth……4.53Setting the analyzer reference level for the reference channel measurement4.54Manual reference mode4.54Inserting the c/N referenceUnits of the c/n reference4.55StandardsUSER Standard4.56User-specific standards4.56Predefined user-specific standards4.59Predefined user-specific standard Digital TX4.59Predefined user-specific standard ANalog tv mode4.60Predefined user-specific standard ctx4.60Measuring the noise channel power and calculating the carrier power/noise power.4.62Frequency setting of the noise channel………4.63Setting the noise channel bandwidth4.64Setting the C/N ratio channel bandwidth4.64Setting the reference level during noise channel measurement.4.65Selecting the c/ N result display..…,…4.65C/N measurement result display4.66Changing the span4.66Correction of inherent noise power4.67Using the R&S FSH in receiver mode4.68Setting the frequencySetting the reference level,,,。.。4.71Setting the bandwidth4.72Setting the detector4.73Setting the measurement time4.73Measurement on multiple frequencies or channels(scan)4.74Measurements using the power sensor4.76Connecting the power sensor……4.76Zeroing the power sensor.4.78Selecting the unit for the power readout4.79Setting the averaging time.……4.80Taking additional loss or gain into account4.81Measuring forward and reflected power∴4.82Zeroing the power sensor4.84Setting the power measurement weighting4.85Selecting the unit for the power readout4.86Taking additional attenuation into account4.881145.5973.126E-15R&S FSHContentsTwo-port measurements with the tracking generator489Measuring the transmission of two-ports4.91Vector transmission measurement494Measuring the transmission magnitude........4.96Measuring the transmission phase4.96Measuring the electrical length when measuring transmission面B国4.99Measuring the group delay when measuring transmission4.100Transmission measurement using the connected VSWR Bridge R&S FSH-Z3.. 4.102Sppectrum measurements with the VsWR Bridge R&s FSH-Z3 or R&S FSH-Z2connectedSetting for detecting the R&S FSH-Z3 in the transm. and spectr. measurement .. 4.104Supplying DC voltage to active DUTs4.105Reflection measurements4.105Scalar measurement of reflection4.106Vector measurement of reflection4.108Measuring the reflection magnitude4.111Measuring the reflection phase.……4.111Measuring the electrical length when measuring reflection4.112Displaying the reflection in the Smith chart4.113Measuring the group delay when measuring reflection4.118Selecting the calibration standards4.120Spectrum measurements with the vswr Bridge r&s FSH-Z3 or R&S FSH-z2connected4.121Settings for detection of the R&SFSH-z2andR&SFSH-Z3………4.122One-Port measurement of cable loss4.123Vector voltmeter.4.124Reflection measurements(S11)4.125Measuring transmission coefficients(S21)4.128Cable measurements4.134Cable selection∴4.135Selecting the frequency range…4.138Calibrating the test setupa.::::::.“14.139Locating cable faults by means of the marker function4.142Measuring spectrum and reflection4.145Further information∴4.146Setting the span4.146Selecting the center frequency.........∴4.147Measurement4.148Length measurement accuracy4.148Using limit Lines∴4.149Measurements with limit lines国面面4.151Definition range of limit lines4.152Data sets containing limit lines...4.1521145.5973.127ContentsR&S FSHMeasuring with Transducer Factors.4.153Unit for measurements with transducers4.156Reference level settings for measurements with transducers4.156Frequency range of transducer………4.156Data sets containing transducer factors4.156Field-Strength Measurement with Isotropic Antenna∴4.157Connecting the antenna to the R&S FSH4.157Measurement of the resultant field strength in a transm. channel with large bandwidth .......4.159Code Domain Power Measurement on 3GPP FDD Signals.4.166Saving and Loading Instrument Settings and Measurement Results4.173Saving results4.174Entering a data set name4.175Loading measurement results.4.175Deleting saved data sets4.176Deleting all data sets4.177Printing out Measurement Results4.178Measurements4.179How a spectrum analyzer operates…4.1791145.5973.12E-15

AWGN信道下，OFDM的Simulink仿真代码。使用QPSK调制，加入了导频信号和循环前缀，理想同步。

IC设计经典教材，《专用集成电路设计实用教程》专用集成电路设计实用教程虞希清编著大學出瓶社图书在版编目(CIP)数据专用集成电路设计实用教程/虞希清编著.一杭州:浙江大学出版社,2007.1ISBN978-7-308-05113-2专..Ⅱ.虞..Ⅲ.集成电路一电路设计一高等学校一教材Ⅳ.TN402中国版本图书馆CIP数据核字(2006)第165341号专用集成电路设计实用教程虞希清编著任编辑张真封面设计张真出版发行浙江大学出版社(杭州天目山路148号邮政编码310028)(E-mail:zupress@mail,hz,zj.cn)(网址http://www.zjupress.com排版杭州好友排版工作室印刷杭州浙大同力教育彩印有限公司开本787mm×1092mm1/16印张18.25字数467千印数2001-3000版印次207年1月第1版2007年7月第2次印刷书号ISBN978-7-30805113-2定价38.00元版权所有翻印必究印装差错负责调换内容提要在现代的IC设计中,工程师们广泛地使用数字电路的逻辑综合技术。工程师们使用RTL代码和IP描述设计的功能,进行高级设计,用综合工具对设计进行编辑和优化,以实现满足设计目标的电路。根据多年为客户进行技术培训,技术支持和IC设计的经验,笔者编写了本书。书中主要介绍了IC设计的基本概念,设计流程和设计方法,并就工程师们在设计中常见的问题,提供了解决方法。本书的特点是实用性强全书共分九章,第一章概述EC设计的趋势和流程;第二章介绍用RTL代码进行电路的高级设计和数字电路的逻辑综合;第三章陈述了IC系统的层次化设计和模块划分;第四章详细地说明如何设置电路的设计目标和约束;第五章介绍综合库和静态时序分析;第六章深入地阐述了电路优化和优化策略;第七章陈述物理综合和简介逻辑综合的拓扑技术;第八章介绍可测性设计;第九章介绍低功耗设计和分析本书的主要对象是IC设计工程师,帮助他们解决IC设计和综合过程中遇到的实际问题。也可作为高等院校相关专业的高年级学生和研究生的参考书。前言本书在 Synopsys公司的逻辑综合培训资料基础上编写而成。从事EDA工作和ASIC设计已有十几年了。在给中港台ASIC设计工程师提供的技术培训和支持中,工程师们曾提出了设计和使用设计工具中遇到的各种各样的问题。教学相长,在和工程师讨论问题、提供解决方案的过程中,我得到了很多的经验和启发。在为用户解决一些实际问题,为他们提供培训后,我曾收到热情的掌声和感谢信。用户的掌声和谢意给了我很大的鼓励和鞭策,使我下决心要编写一本实用的中文版的集成电路设计教程和手册,以答谢用户们的支持和帮助。本书讲究实用性,希望其中的内容能帮助ASIC设计工程师清楚明了IC设计的基本概念,IC设计的流程,逻辑综合的基本概念和设计方法,解决进行IC设计时和工具使用时所遇到的问题。全书共分九章,第一章概述IC设计的趋势和流程;第二章介绍用RTL代码进行电路的高级设计和数字电路的逻辑综合;第三章陈述了IC系统的层次化设计和模块划分;第四章详细地说明如何设置电路的设计目标和约束;第五章介绍综合库和静态时序分析;第六章深入地阐述了电路的优化和优化策略;第七章陈述物理综合和简介逻辑综合的拓扑技术;第八章介绍可测性设计;第九章介绍低功耗设计和分析本书的主要对象是IC设计工程师,帮助他们解决IC设计和综合过程中遇到的实际问题。也可作为高等院校相关专业的高年级学生和研究生的参考书。在本书的编写过程中,得到了 Synopsys中国区高级技术经理常绍军先生的大力支持。常绍军先生、资深的应用技术顾问李昂先生和冯源先生审阅了本书,并提出了宝贵的意见和建议。在此,表示衷心的感谢。在本书编写过程中,得到了全家的支持,深表谢意!由于时间仓促,知识水平有限,书中难免有不足和错误之处,敬请各位专家,IC设计工程师和同行们批评指正,不胜感激。来函可发电子邮件( Email: victory_snps@ yahoo.com.hk)。虞希清2006年11月于 Synopsys香港目录第一章集成电路设计概论1.1摩尔定律………………∴…………11.2集成电路系统的组成1.3集成电路的设计流程第二章数字电路的高级设计和逻辑综合132.1RTL硬件描述语言设计132.1.1行为级硬件描述语言( Behavioral Level hdi)132.1.2寄存器传输级硬件描述语言( RTL HDI)172.1.3结构化硬件描述语言( Structure HDL)………………………………232逻辑综合(L。 gic Synthesis)…………………272.2.1逻辑综合的基本步骤…282.2.2综合工具 Design Compiler302.2.3目标库和初始环境设置鲁·自自音甲·是着音鲁备.··非曲●d■···●····第三章系统的层次化设计和模块划分353.1设计组成及 DC- Tcl…·自音···········日·········.···卡器日音是·晶自鲁bt·。……353.1.1设计物体( Design Object)鲁音自353.1.2 DC - Tcl简介香看·鲁·鲁·鲁.鲁自春3.2层次( Hierarchy)结构和模块划分( Partition)及修改463.2.1层次结构的概念463.2.2模块的划分…息鲁483.2.3模块划分的修改·看。51第四章电路的设计目标和约束…°。●看。面●554.1设计的时序约束…普·非鲁·鲁击曲■554.1.1同步( Synchronous)电路和异步( Asynchronous)电路…4.1.2亚稳态( Metastability)574.1.3单时钟同步设计的时序约束…血D。e574.1.4设计环境的约束724,1.5多时钟同步设计的时序约束…………794.1.6异步设计的时序约束832专用集成电路设计实用教程4.1.7保持时间( Hold Time)854.2复杂时序约束看香鲁e鲁曲鲁。自鲁自。a。自鲁自。鲁4.2.1多时钟周期( Multi-Cycle)的时序约束874.2.2门控时钟的约束904.2.3分频电路和多路传输电路的时钟约束鲁·看看看鲁924.3面积约束……………………………96第五章综合库和静态时序分析…985.1综合库和设计规则···········.······.··4·a·.·····◆···—985.1.1综合库……5.1.2设计规则1075.2静态时序分析5.2.1时序路径和分组1125.2.2时间路径的延迟1145.2.3时序报告和时序问题的诊断鲁·.···.·自击击合音。甲。。。●。。●……115第六章电路优化和优化策略…1206.1电路优化..···4····;··.·.·.·.·a·a·;··1226.1.1 Synopsys的知识产权库- Design Ware1236.1.2电路优化的三个阶段………………………1266.2优化策略…………1346.2.1编辑策略垂由d垂……1356.2.2自动芯片综合( Automated Chip Synthesis)………………………………1416.3网表的生成格式及后处理144第七章物理综合1487.1逻辑综合(L。 gic Synthesis)遇到的问题……………………1487.2物理综合( Physical Synthesis)的基本流程鲁鲁自谁…………………………1517.3逻辑综合的拓扑技术( Topographical Technology)…………162第八章可测试性设计…1748.1生产测试简介…………1748.2可测试性设计鲁D曹吾音·非·自·········着4鲁4鲁是1768.2.1物理瑕疵和故障模型1768.2.2D算法( D algorithm)1788.3测试协议( Test protocol)1858.4测试的设计规则·●鲁q鲁·音鲁鲁D鲁香曹音音音·自自··。·非鲁曲··●1908.4.1可测试性设计中的时钟信号1908.4.2三态总线和双向端口的测试。非……………………198录8.5门级网表可测试问题的自动修正2048.6扫描链的插入2088.7可测试设计的输出和流程2228.8自适应性扫描压缩技术………225第九章低功耗设计和分析2299.1工艺库的功耗模型…………2319.2功耗的分析…鲁鲁鲁……………2379.3低功耗电路的设计和优化2519.3.1门控时钟电路25293.2操作数分离………2619.3.3门级电路的功耗优化●·4·■D鲁曹春击自由2669.3.4多个供电电压( Multi-VDD)…2749.3.5电源门控………276参考文献……………………281第一章集应电路设计概记集成电路( Integrated Circuits)是现代电子设备的重要组成部分。因此,成功设计集成电路对整个电子信息技术产业的发展起到重要的作用。由于科技的发展,半导体芯片的集成化程度越来越高,设计的系统越来越复杂,规模越来越大,设计的性能越来越髙,功耗也越来越大,这些不断地给芯片设计工程师和电子设计自动化( Electronics Design Automation,简称EDA)厂商提出新的课题和挑战。1.1摩尔定律摩尔提出著名的“摩尔定律”已经40多年了。1965年4月,摩尔在《电子学( Electronics)》杂志上发表文章预言,半导体芯片上集成的晶体管数量将每年翻一番。1975年,他又提出修正说,芯片上集成的晶体管数量将每两年翻一番。晶体管数量MOORES LAWIntels Tanuma 2 Processo1000000000ante△nmtele Pentium Pr100000000Intels Pentium m Processoitels Pentium Pro10000000Intelstuma Printels*v Proces1000000Intel388 pre28610000080801000080084004●100019701975198019851990199520002005年度图1.1.1图1.1.1为在过去25年, ntel CPu中晶体管增长的情况。集成电路的规模不断地稳

1）显示商品的相关信息a.包括主页面以及各子页面，主要用于加载各商品的图片和信息。b. 点击“查看”功能，点击后显示商品的详细资料。2）用户登录界面包括会员的登录，以及密码丢失后的寻找功能。3）会员注册功能包括会员的登录的帐号、密码以及会员的相关详细资料。4） 会员相关信息的显示及修改功能a. 显示会员注册时所填写的相关资料。b. 当会员发现注册资料有误或有所变更时，可以通过该项对资料进行校正，以免出现不必要的损失。5）订购系统本系统为用户提供的是购物车模式，用户可以通过点击商品后，商品会自动加载到购物车面板，用户确定所需商品后，只需点击确定即可。6）拍卖系统本系统提

Hyres 3.1(分辨率测试软件) 和ISO12233测试标板的使用和判读，有兴趣的童鞋可以看看。

Simulink实现ASK FSK PSK数字信号调制与解调仿真——源程序及报告

该代码为MATLAB代码类型，matlab（程序）分析了二维码编码技术，基于图像处理的解码技术，及其编码实现过程。针对解码识别过程，详细分析了基于图像处理的预处理方法，包括二维码灰度化处理、图像平滑和二值化过程，同时针对二维码实际情况，

电子工业出版社，2005.2.第1章 合成孔径雷达图像的物理基础；第2章 合成孔径雷达的原理；第3章 星载合成孔径雷达系统；第4章 合成孔径雷达图像；第5章 相干斑的模型；第6章 反射系数的估计与SAR图像滤波；第7章 SAR图像分类；第8章 点、边缘和线的检测；第9章 雷达几何与地形几何；第10章 雷达立体测量；第11章 雷达斜坡测量；第12章 雷达干涉测量；第13章 条纹的展开；第14章 雷达海洋探测；