Doyub Kim Fluid Engine Development.pdf
( Doyub Kim Fluid Engine Development.pdf )Doyub Kim Fluid Engine Development.pdfTaylor francisTaylor Francis Grouphttp://taylorandfrancis.comT& F Cat #K25519K25519C000— page l-10/21/2016-17:12LUID ENGINEDEVELOPMENTDOYUB KIM(CRC CRC PressTaylor & fiBoca raton london new yorkCRC Press is an imprint of theTaylor francis Group, an informa businessAN AK PETERS BOOKT& F Cat #K25519—K25519C000- page l-10/21/2016—17:12CRC PressTaylor Francis Group6000 Broken Sound parkway nw, suite 300Boca Raton, FL 33487-274@2017 by Taylor Francis Group, LLCCRC Press is an imprint of Taylor Francis Group, an Informa businessNo clain lo original U.S. Government worksPrinted on acid-free paperVersion date: 20161019International Standard book Number -13: 978-1-4987-1992-6(Pack- Book and ebook)This book contains information obtained from authentic and highly regarded sources. Reasonable effortshave been made to publish reliable data and information, but the author and publisher cannot assumeresponsibility for the validily of all materials or the consequences of their use. The authors and publisherhave attempted to trace the copyright holders of all material reproduced in this publication and apologize toc ht holders if permission to publish in this form has not been obtained If any cocht m aterial hnot been acknowledged please write and let us know so we may rectify in any future reprintExcept as permitted under U.S. Copyright L aw, no part of this book may be reprinted, reproduced, transmitted, or utilized in any form by any electronic, mechanical, or other means, now known or hereafter invented,including photocopying, microfilming, and recording, or in any information storage or retrieval system,without written permission from tblishTorpermissiontophotocopyorusematerialelectronicallyfromthisworkpleaseaccesswww.copyrightcom(http://www.copyright.com/)orcontacttheCopyrightClearanceceNter,inC.(ccc),222RosewoodDrive, Danvers, MA 01923, 978-750-8400. CCC is a not-for-profit organization that provides licenses andregistration for a variety of users. For organizations that have been granted a photocopy license by the CCC,a separate system of payment has been arranged.Trademark Notice: Product or corporate names may be trademarks or registered trademarks, and are usedonly for identification and explanation without intent to infringeLibrary of Congress Cataloging-in-Publication DataNames: Kim, Doyub, author.Title: Fluid engine development/Doyub KimDescription: Boca Raton: Taylor Francis, a CRC title, part of the TaylorFrancis imprint, a member of the taylor Francis group the academicdivision of T&F Informa, plc, [2017] Includes bibliographical referencesnd indIdentifiers: LCCN 2016028981 ISBN 9781498719926(hardback: acid-free paperSubjects: LCSH: Hydrodynamata processing. Fluids--Computer simulaticClassilication: LCC QA911 K485 2017 DDC 532.00285, 66--dc23Lcrecordavailableathttps://icCn.loc.sov/2016028981Visit the Taylor& Francis Webhttp://www.taylorandfrancis.comand the Crc Press Web site athttp!/www.crcpT&FCat#K25519K25519000— page iv-10/21/2016—17:12To my wifeT& F Cat #K25519K25519C000— page v-10/21/2016-1712Taylor francisTaylor Francis Grouphttp://taylorandfrancis.comT& F Cat #K25519K25519C000— page l-10/21/2016-17:12ContentsPresaList of FigureslI1 Basics1.1 Hello. Fluid SinIdulator1.1.1 Defining State1.1.2 Computing Motion1. 1.3 Boundary handling11.4 Visualization11134621.1.5 Final Rcsult1.2 How to read This book121.2.1 Getting the Codes131.2.2 Rcading codcs131. 2.2. 1 Languages131.2.2.2 Source code st131.2.2.3 Naming Conventions141.2.2.4 Constants151.2.2.5 Array151.2.3 Reading math Expressions01.2.3.1 Scalar. Vector and Matrix201.3 Math1.3. 1 Coordinate System211.3.2 Vector211.3.2.1 Basic Operations241.3.2.2 Dot and cross product261.3.2.3 More Operations273.3 Matri1.3.3.1 Basic Matrix Operations1.3.3.2 Sparse Matrix361.3.4 System of Linear Equations371.3.4.1 Direct Methods1.3.4.2 Indirect Methods381. 3.5 Field421.3.5.1 Partial derivative451.3.5.2 GradientT&FCat#K25519—K25519C000— page vll-10/21/2016-17:12Contents1.3.5.3 Divergence481.3.54C511.3.5.5 Laplacian531.3.6 Interpolation561.3.6.1 Nearest point581.3.6.2 Linear Interpolation591.3.6.3 Cat, mull-Rom Spline Interpolation61eometry631. 4.1 Surface671.4.3 Implicit Surface to Explicit Surface1.4.4 Explicit Surface to Implicit Surface1.5 Animation番普721.6 Physics-Based Animation1.6.1 Getting Started771.6. 2 Physics Animation with Example781.6.2. 1 Choosing a Model781. 6. 2.2 Simulation State791.6.2.3 Force and Motion801.6.2. 4 Time Integration871.6. 2.5 Constraints and collisions891.7 Fluid Animation911.7.1 Gravity1.7.2P1.7.3 Viscosity1.7.4 Density Constraint2 Particle-Based Simulation992.1 Seeing the World Like Seurat992 Data Structi2.2.1 Particle System Data1002.2.2 Particle System Example2.2.3 Neighbor1082.2.3.1 Searching Nearby Particlesl092.2.3.2 Caching Neighbors2.3 SOothed Particles116asics2.3.1.1 Kernel1172.3.1.2 Data Model119lerdO1202.3.1.4 Density1212.3.1.5 Differential Operators2.3.2 Dynamics1302.3.2. 1 Solver Over view1312.3.2.2 Pressure gradient Force133T&FCa#K25519—K25519C000— page vil-10/21/2016—17:12Contents2.3.2.3 Viscosity1372.3.2.4 Gravity and Drag Forces1372.3.3 Results and limitations1382.4 Incompressible SPii with Larger Time-Step12.4Predict and correct2.4.2 Implementation2.4.3 Results1472.5 Collision Handling1492.5.1 Defining colliders1502.6 Discussion and further reading1553 Grid-Based simulation1573.1 Pixelating the World1573. 2 Data Structures1573.2.1 Types of grid1593.2.2 Grid System D1663.3 Differential Operators1693.3.1 Finite difference1703.3.2 Gradient1723.3. 3 Divergence1733.3.4 Curl1763.3.5 Lap1783. 4 Fluid simulation1803.4.1 Collision Handling1823.4.1.1 Collider to Signed-Distance Field1823.4.1.2 Boundary Conditions1833.4.2 Advection1873.4.2.1 Semi-Lagrangian Method1883.4.2.2Ing Backg Accurac1923.4.2.3 Improving Interpolation Accuracy1943.4.2.4 Boundary handlingg1963.43G1983.4.4. 1 Solving Diffusion with Forward Euler1993.4.4.2 Stability of diffuusIonSol2013.4.4.3 Solving DiffusiOn with Backward Euler2033.4.4.4 Boundary Handling2083.4.5 Pressure and Incompressibility2113.4.5. 1 Building matrix2143.5 Smoke simulation2203.5.1 Buoyancy Force2223.5.2 Advection and Diffusioll3.6 Fluid with Surface2233.6.1 Defining surfacc on grids233.6.1.1 Tracking the Surface under the Flow263.6.1.2 Reinitializing Signed-Distance Field226T&FCat#K25519—K25519C000— page ix-10/21/2016—17:12
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wifi 802.11n 协议标准
wifi 802.11n 协议标准Contents2. Normative references ........................................................................................................................... 13. Definitions ...........................................................................................................EEE Std802.11n"-2009(Amendment to ieEE Std 802.11-2007as amended by ieee std 802. 11k-2008EEE Std80211r-2008, EE Std802.11y-2008,and IEEE Std 802. 11w-2009)EEE Standard forInformation technology-Telecommunications and informationexchange between systems-Local and metropolitan area networks-Specific requirementsPart 11: Wireless LAN Medium Access Control (MAC)and Physical Layer(PHY SpecificationsAmendment 5: Enhancements for HigherThroughputSponsorLANIMAN Standards committeeof theIEEE Computer SocietyApproved 11 September 2009IEEE-SA Standards boardAbstract: This amendment defines modifications to both the IEEE 802 1 1 physical layer(PHY)andthe IEEE 802 11 medium access control (MAC) sublayer so that modes of operation can be enabledthat are capable of much higher throughputs, with a maximum throughput of at least 100 Mb/s, asmeasured at the Mac data service access point (SAP)Keywords: high throughput, MAC, medium access control, MIMO, MIMO-OFDM, multiple inputmultiple output, PHY, physical layer, radio, wireless local area network, WLANThe Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue New york NY 10016-5997 USACopyright@ 2009 by the Institute of Electrical and Electronics Engineers, IncAll rights reserved. Published 30 October 2009. Printed in the United States of AmericaIEEE is a registered trademark in the U.S. Patent Trademark Office, owned by the Institute of Electrical and ElectronicsEngineers, IncorporatedPDFSBN978-0-7381-60467STD95961Print:|SBN9780-7381-6047-4STDPD95961No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the priorwritten permission of the publisherIEEE Standards documents are developed within the ieee Societies and the standards Coordinating Committees ofthe IEee Standards Association (IEEE-SA) Standards Board. The ieee develops its standards through a consensusdevelopment process, approved by the American National Standards Institute, which brings together volunteersrepresenting varied viewpoints and interests to achieve the final product. Volunteers are not necessarily members of theInstitute and serve without compensation. While the ieee administers the process and establishes rules to promotefairness in the consensus development process, the ieee does not independently evalof any of the information or the soundness of any judgments contained in its standar uate, test, or verify the accuracyUse of an IEEE Standard is wholly voluntary. The ieee disclaims liability for any personal injury, property or otherdamage, of any nature whatsoever, whether special, indirect, consequential, or compensatory, directly or indirectlyresulting from the publication, use of, or reliance upon this, or any other iEFF Standard documentThe ieee does not warrant or represent the accuracy or content of the material contained herein, and expresslydisclaims any express or implied warranty, including any implied warranty of merchantability or fitness for a specificpurpose, or that the use of the material contained herein is free from patent infringement. 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Users arecautioned to check to determine that they have the latest edition of any IEEE StandardIn publishing and making this document available, the IEee is not suggesting or rendering professional or othcrservices for, or on behalf of, any person or entity. Nor is the IEEE undertaking to perform any duty owed by any otherperson or entity to another. Any person utilizing this, and any other IEEE Standards document, should rely upon his orher independent judgment in the exercise of reasonable care in any given circumstances or, as appropriate, seek theadvice of a competent professional in deternining the appropriateness of a given IEEE standardInterpretations: Occasionally questions may arise regarding the meaning of portions of standards as they relate tospecific applications. When the need for interpretations is brought to the attention of IEEE, the Institute will initiateaction to prepare appropriate responses. Since IEFF Standards represent a consensus of concerned interests, itimportant to ensure that any interpretation has also received the concurrence of a balance of interests. For this reason,IEEE and the members of its societies and Standards Coordinating Committees are not able to provide an instantresponse to interpretation requests except in those cases where the matter has previously received formal considerationA statement, written or oral, that is not processed in accordance with the IEEE-SA Standards Board Operations Manualshall not be considered the official position of ieee or any of its committees and shall not be considered to be, nor berelied upon as, a formal interprctation of the IEEE. At lectures, symposia, seminars, or educational courses, anindividual presenting information on IEEE standards shall make it clear that his or her views should be considered thepersonal views of that individual rather than the formal position, explanation, or interpretation of the IeEeComments for revision of IEEE Standards are welcome from any interested party, regardless of membership affiliationwith IEEE. Suggestions for changes in documents should be in the form of a proposed change of text, together withappropriate supporting comments. Recommendations to change the status of a stabilized standard should include atonale as to why a revision or withdrawal is required. Comments on standards and requests for interpretations shouldbe submitted to the following addressSecretary, IEEE-SA Standards board445 Hoes lanePiscataway, NJ 08854USAAuthorization to photocopy portions of any individual standard for internal or personal use is granted by The Instituteof Electrical and Electronics Engineers, Inc, provided that the appropriate fee is paid to Copyright Clearance CenterTo arrange for payment of licensing fee, please contact Copyright Clearance Center, Customer Service, 222 RosewoodDrive, Danvers, MA 01923 USA; +1978750 8400 PerImission lo photocopy portions of any individual standard foreducational classroom use can also be obtained through the Copyright Clearance CenterIntroductionThis introduction is not part of IEee Std 802. 11n-2009, IEEE Standard for Information technology-Telecommunications and information exchange between systems--Local and metropolitan networks--Specifirequirements-Part 11: Wireless LAN Medium Access Control(MAC) and Physical Layer(PHY) SpecificationsAmendment 5: Enhancements for Higher ThroughputThis amendment specifies enhancements to IEEE 802. 11 physical layer(PHY)and medium access control(MAC) sublayer to provide modes of operation with useful data rates substantially higher than thosepreviously available. Significantly higher IEEE 802. 11 wireless local area network(WLAN) throughput isexpected to improve user experiences for current applications and to enable new applications and marketsegmentsNotice to usersLaws and requlationsUsers of these documents should consult all applicable laws and regulations. Compliance with theprovisions of this standard does not imply compliance to any applicable regulatory requirementsImplementers of the standard are responsible for observing or referring to the applicable regulatoryrequirements. iEEE does not, by the publication of its standards, intend to urge action that is not incompliance with applicable laws, and these documents may not be construed as doing so on that is not inCopyrightsThis document is copyrighted by the Ieee. It is made available for a wide variety of both public and privateuses.These include both use, by reference, in laws and regulations, and use in private self-regulationstandardization, and the promotion of engineering practices and methods. By making this documentavailable for use and adoption by public authorities and private users, the ieee does not waive any rights incopyright to this documentUpdating of IEEE documentsUsers of ieFF standards should be aware that these documents may be superseded at any time by theissuance of new editions or may be amended from time to time through the issuance of amendments,corrigenda, or errata. An official ieee document at any point in time consists of the current edition of thedocument together with any amendments corrigenda or errata then in effect In order to determine whethera given document is the current edition and whether it has been amended through the issuance ofamendmentscorrigendaorcrrata,visittheIeeEStandardsAssociationwebsiteathttp://ieeexplore. ieee. org/xpl/standards. jsp or contact the iEee at the address listed previously.For more information about the IEEE Standards Association or the Ieee standards development process,visittheIeeE-sawebsiteathttp://standards.ieeeorgErrataErrata,ifanyforthisandallotherstandardscanbeaccessedatthefollowingUrl:http://standards. ieee. org/reading/ieee/updates/errata/index. html. Users are encouraged to check this URL forta periodicallyInterpretationsCurrentinterpretationscanbeaccessedatthefollowingUrl:http://standards.ieeeorg/reading/ieee/interp/index htmlCopyright C 2009 IEEE. All rights reservedPatentsAttention is called to the possibility that implementation of this amendment may require use of subjectmatter covered by patent rights. By publication of this standard, no position is taken with respect to theexistence or validity of any patent rights in connection therewith. a patent holder or patent applicant hasfiled a statement of assurance that it will grant licenses under these rights without compensation or underreasonable rates, with reasonable terms and conditions that are demonstrably free of any unfairdiscrimination to applicants desiring to obtain such licenses. Other Essential Patent Claims may exist forwhich a statement of assurance has not been received. The Ieee is not responsible for identifying EssentialPatent Claims for which a license may be required, for conducting inquiries into the legal validity or scopeof Patents Claims, or determining whether any licensing terms or conditions are reasonable or nondiscriminatory. Users of this standard are expressly advised that determination of the validity of any patentrights, and the risk of infringement of such rights, is entirely their own responsibility. Further informationmay be obtained from the ieee Standards associationParticipantsWhen this amendment was sent to sponsor ballot, the IEEe 802. 11 Working Group had the followingofficersBruce P. Kraemer, ChairJon Walter Rosdahl, Vice Chair; Treasurer; and Chair, Task Group mbAdrian P. Stephens Vice chairStephen McCann, Secretary and Chair, Publicity standing Committee and Task group uTerry L. Cole, Technical Editor and Assigned Number AuthorityTeik-Kheong Tan, Chair, Wireless Next Generation Standing CommitteeDavid Bagby, Chair, Architecture Standing CommitteeBruce p. kraemer Co-Chair IMT-Advanced ad hoc commiteeLee armstrong, Chair, Task Group pDonald E Eastlake Ill, Chair;, Task Group sNeeraj Sharna, Chair, Task group lDorothy V. Stanley, Chair, Task Group v and IETF Ad hoc CommitteeJesse Walker, Chair. cTl Ad hoc committeePeter Ecclesine, Chair, Task group yMenzo Wentink, Chair, Task group zGancsh Venkatesan, Chair, Task Group aaEldad Perahia, Chair, Very High Throughput Study groupDarwin Enger, Co-Chair. IMT-Advanced ad hoc committeeWhen this amendment was sent to sponsor ballot, Task Group n had the following officersBruce P Kraemer. chairSILi. vice chairGarth Hillman and Jon Walter Rosdahl, SecretaryAdrian P. Stephens, Technical editorWhen this amendment was sent to sponsor ballot, the IEeE 802. 1l Working Group had the followingmembershiOsama S. aboulmagdMalik audchAmit bansalTomoko adachiCcrt A, awatoJohn. barrAlok aggarwalDavid bagbGal bassonCarlAldanaMichael bahrussa BavafaThomas AlexanderFan baiTuncer BaykasLee r. ArmstrongGabor BaikoJohn L. BenkoAlex ashleyDennis j. bakerMathilde benvenisteCopyright C 2009 IEEE. All rights reservedBiorn A. berkeRobert Y huangChiu ngoDaniel borgesDavid hunterEero nikulaAnthony braskichYasuhiko inoueRichardH. noensJoseph brennanAkio isoHideaki odagiriDavid britzJunghoon JeeJisung OhG. BumillerHongseok JeonChandra s. olsonNancy Cam-WingetYeonkwon JeongYouko omorNecati CanpolatJorjeta G JetchevaSatoshi oyamaJavier cardonaLusheng jiRichard H. PaineDouglas s ChanDaniel JiangAuld. palaniveluClint F. ChaplinPadam AflChangmin ParkCarl W. KainJungsoo parkMinho CheongNaveen K KakanMinyoung ParkMasato katoⅤ ijaykumar PatelNakjungDouglas KanBcminih. peirisLiwen chuRichard H. KennedyEldad perahiaTerry L. ColeJohn KenneJames e. petranovichRyon K. ColemanStuart 3. KerryAl PetrickCharles IJoonsuk kinFahd pirzadaTodor CooklevKyeongpyo KimJames d. portaroXavier p CostaSeong S. kimHenry s. PtasinskiDavid E CypherYongsan KimRene purnadiMarc de courvilleJarkko kneckChang w. PyoRolf J de vegtMark m. kobayashiEmily H QiTheodorus denteneerFumihide KojimaLuke QianJeremy de vriesTom KolzeHuyu QuSusan DickeyBruccp KJim e raabZhiming DingJohannes P KruysⅤ nuth raiYoshiharu doThomas KuehnelAli RaissiniaJohn dorseyThomas m. KuriharaHarish ramamurthyRoger P durandStephen G raymentSrinivasa duvvuriEdwin kwonLeonid razoumovDonald e. eastlakeZhou lanIvan reePeter Ecclesiaejeremy A landtEdward reussMichael ellisJoseph P. lauerAlex reznikStephen P. EmeottTae H. LeeRandal roebuckMarc emmelmannWooyoung leeJon walter rosdahlDarwin EngwerJoseph levyRichard royJoseph epsteinSheung liAlexander safonovⅤ inko ercegPaul linKazuyuki sakodaLars p. falkIlang liuHemanth sampathRobert fanfcllMichael livshitzKatsuyoshi SatoStefan fechterPeter LocHirokazu sawadaPaul h. feinberDaniel lubarDon schultzMatthew FischerAnthony f. maidaYongho SeokWayne k. FisherJakub majkowskiHuairong shaoRoberta fracchiAlastair MalarkyNeeraj sharmaRyuhei FundaJouni K. malinenStephen J ShellhammerMatthew gastAlexander maltsevlan SherlockJames p gilbBill marshallKai shiJeffrey gilbertRoman m. maslennikovShusaku shimadaReinhard GlogerSudheer mattaFrancois simonDavid goodallStephen Mc cannHarkirat SinghTugrul guenerJustin p mcnewGraham K. SmithJianlin gven meseckeMatt smithMark hamiltonRobert r. millerYoo-Seung SongC.J. HanseMichael monteKapil seBrian d. hartRajendra T. moortiVinay SridharaAmer A haHitoshi moriokaDorothy stanleⅤ egard hasselPeter MurrayAdrian P. StephensRobert f heileAndrew milesDavid S Stephenson〔 undo r. HertzRohit nabarCarl R. StevensonJunling hiJohn stineWendong huKengo nagataGuenaelt strutCopyright C 2009 IEEE. All rights reservedChin s SumGanesh VenkateHarry R. worstellEiji TakagiDalton t.Ⅴ ictorPengfei xiaMineo takaiGeorge A. vlantisAkira yamadaTcik-Khcong TanCssc r. walkerTakeshi yamamotoAllan thomsonunlWangmoya yamauraJerry thrasherngEric okuboCraig d. WarrenSu K. YongAlexander TolpinFujio WatanabeSeiji YoshioJason trachewskyPatrick WayeChristopher YoungSolomon b. traininMenzo m. wentinkArtur zaksRichard D. Van NeeFrank whettenHongyuan zhangAllert van zelstKyle williamsHuimin zhangMathieuⅤ arlet-AndmJames worshamJing zhiPrabodh varshneyJuan ZunigaContributions to this amendment was received from the following individualsBill ablⅵ inko ErcegPatrick labbeSantosh abrahamMustafa rozJoseph lauerTomoko adachiStefan fechterDongjun leeDmitry akhmetovPaul feinbergLin-Nan leeCarlos aldanaMatthew fischereeDave andrusGuido frederiksSok-kyu LeeMicha anholtTakashi FukagawaZhongding leiTsuguhide AokiPatrick FungJoseph levyYusuke asarEdoardo gallizioScott leyonhjelGeert awaterJames gardnerPen liDavid BaDevis gattSheung LiRaja banerjeaDavid HedbergYuan liKaberi banerieeGarth hillmanKevin liaoAmit bansalJin-Meng hoIsaac limGal bassonDale hocevarAlfred linAnui batraLouise hooAlbert liuJohn benkoMuhammad akramDer-Zheng liuMathilde benvenisteYasuhiko inoueMichael livshitzBjorn BjerkeKaz ishidaYufei BlakenshipTakashi ishidoshiroPeter LojkoDaniel borgesLakshmi lyerHui-Ling LouDouglas chanEric JacobsonAdina matacheJerry ChangYuh-Ren jauhLaurent mazetJohn ChangTaehyun JeonWilliam mcfarlandJeng-Hong ChenJari JokelaDarren mcnamaraStephen ChenVKJonesIrina medvedevYi-Ming ChenPadam AflArnaud meylanPei-ju ChiangNaveen KakaniMorgan mikFrancois chinSriniavs kandalaSeungwook minWoon Hau ChinAteet KapurPatrick mo上 mily chouAssaf KasherAndy molischLiwen chuMasato katoR. Tushar moortiKeith ChuggJohn KetchumMike moretonBrian ClassonJoonsuk KYuichi moriokaSean CoffeyPansop KimMarkus muckGabriella convertinoYoungsoo KimSyed Aon mujtabaMarc de courvilleGuenter KleindlAndrew mylesRolf de vegtKiyotaka KobayashiRohit nabarFranz dielacherCenk Koselhasa NagaiYoshiharu doiBruce p KraemerKengo NagataJohn deThomas KuehnelSeigo NakaodouglasTakushi KunihiroSanjiv nandaPeter ecclesiaeJoe KwakChiu nDarwin EngwerJoseph kwakAjit NimbalkerLeonid epsteinEdwin kwonGunnar NitscheCopyright C 2009 IEEE. All rights reservedHuaning NiuErik SchylanderRichard van neeIvan oakesMichael sealsNico van waesYoshihiro ohtanilual-Rong ShaoAllert van zelstEric OjardSuman sharmaAndres vila casadoTakeshi onizawaSteve shellhammerGeorgeⅵ lantisJob oostveenIan SherlockTimothy WakeleyFabio osnatoMasaaki shidaJesse walkerKafle padamTakashi shonoBrad wallacePratima paiSebastien SimoensMark wallaceArul palaniveluMassimiliano sitiRod waltonSubra parameswaraDoug SmithQi WThomas pareMatt smithXiaowen WangJean-Noel PatillonAmjadDeric WatersWei-Chung PengRobert staceyMark WebsterEldad perahiaAdrian P. StephensMenzo WentinkJim petranovichRichard WeseKrishna madhavan pillaiVictor StolpmanMike WilhoyteMadhavan pillaiSumei sunTimothy WongAngelo PoloniXiantao sunJames WoodyattNeeraj poojaryShravan surineniHenry ptasinskiIlan sutskoverAriton XhafaAleksandar PurkovicEiji Takagio xiaLuke oianMasahiro takasTomoya YamauraAli RaissiniaSeiichiro TakahashiEric YangSthanunathan ramakrishnanDaisuke takedaWen-Chang YehHarish RamamurthyTeik-Kheong TanChristopher YoungSridhar rameshYasuhiro TanakaHeejung YuRaffaele rivaStephan ten brinkArtur ZaksJon walter rosdahlGanesan ThiagarajanEldad zeiraStephanie Rouquette-LeveilEric OkuboHongyuan zhaMike rudeTim TowellJin ZhangJohn sadowskiJason trachewskyNing ZhangAtul salhotraSolomon traininQuan ZhouVincenzo scarpaDavid tungJohnny ZweigDonald schultzStefano valleJim syrenThe following members of the individual balloting committee voted on this amendment. Balloters may havevoted for approval, disapproval, or abstentionOsama aboulmagdBill cannonSouray duttaTomoko adachiJing CaoRichard eckardAlok AggarwalEdward CarlesCarl EklundThomas alexandeJames CarloStephen emeottRichard AlvinJuan CarreonMarc emmelmannEdward ChalfDarwin EngwcButch AntonDouglas s ChanJoseph epsteinDanilo antonelliKuor-Hsin ChangRobert fanfelleClint ChaplinShahin FarahaniDavid BagbyWei-Peng ChenShulan FengGabor BaikoYung-Mu ChenOddgeir FikstvedtMatthew ballHong ChengMatthew fischerRaja banerjeaAik ChindapoPrince francisVered BKeith ChowAvraham FreedmanJohn barrLiwen ChuDevon gaylePhilip beecherRyon ColemanMichael GeipelMathilde benvenisteCharles cookTheodore Georgantasharry bimsTodor CookiePieter -Paul giesbertsBjorn BjerkeHelge CowardJames gilbMonique brownJoseph decuirReinhard glogerRussell dietzMariana goldhamerWilliam byrdThomas dineenScrgiu gomaPctcr. calderonJohn dorseyDavid goodallCopyright C 2009 IEEE. All rights reserved
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